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Pattern Recognition Letters
Volume 20, Issue 1, January 1999, Pages 41-47
 
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doi:10.1016/S0167-8655(98)00127-5    How to Cite or Link Using DOI (Opens New Window)
Copyright © 1999 Elsevier Science B.V. All rights reserved.

Ellipse detection based on symmetry

Yiwu Lei* and Kok Cheong Wong1

Centre for Graphics and Imaging Technology, School of Applied Science, Nanyang Technological University, Nanyang Avenue, Singapore 639798, Singapore

Received 12 January 1998;
revised 14 September 1998.
Available online 16 April 2003.

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Abstract

In this paper, a novel and generic approach is proposed for detecting ellipses from symmetric contours in a picture efficiently. The idea is based on the detection of the symmetric axes from contours in a Hough-based approach, so as to transform a high-dimensional problem into two two-dimensional ones. From the idea, the algorithms for detecting symmetric axes and ellipses are designed and tested. From the algorithm analyses, this method is practical and runs faster than the current-reported methods. By experiments, this method demonstrates highly effective and robust results.

Author Keywords: Symmetry detection; Ellipse detection; Feature extraction; Image processing

Article Outline

1. Introduction
2. Finding symmetric axes from contours
3. Finding ellipses from contours
4. Refinement
5. Analyses of algorithms
6. Experiments and analyses
7. Conclusions
Acknowledgements
References






 
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