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Pattern Recognition Letters
Volume 24, Issue 16, December 2003, Pages 3059-3068
 
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doi:10.1016/S0167-8655(03)00165-X    How to Cite or Link Using DOI (Opens New Window)
Copyright © 2003 Elsevier B.V. All rights reserved.

Detecting pattern-based outliers

Tianming HuCorresponding Author Contact Information, E-mail The Corresponding Author and Sam Y. Sung

Department of Computer Science, National University of Singapore, Singapore 117543, Singapore

Received 11 January 2003; 
revised 23 June 2003. 
Available online 29 July 2003.

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Abstract

Outlier detection targets those exceptional data that deviate from the general pattern. Besides high density clustering, there is another pattern called low density regularity. Thus, there are two types of outliers w.r.t. them. We propose two techniques: one to identify the two patterns and the other to detect the corresponding outliers.

Author Keywords: Outlier detection; Complete spatial randomness; Clustering; Regular spacing

Article Outline

1. Introduction
2. Related work
3. Pattern-based outliers
3.1. Patterns based on complete spatial randomness
3.2. Identifying clustering and regularity
3.3. Detecting pattern-based outliers
3.4. Properties of VOV
4. Experimental evaluation
4.1. Evaluating outlier detection approaches
4.2. Synthetic data
4.3. Real data
5. Conclusion
References







Pattern Recognition Letters
Volume 24, Issue 16, December 2003, Pages 3059-3068
 
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