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Pattern Recognition Letters
Volume 22, Issues 6-7, May 2001, Pages 753-758
 
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doi:10.1016/S0167-8655(01)00017-4    How to Cite or Link Using DOI (Opens New Window)
Copyright © 2001 Elsevier Science B.V. All rights reserved.

A graph distance metric combining maximum common subgraph and minimum common supergraph

Mirtha-Lina FernándezCorresponding Author Contact Information, E-mail The Corresponding Author, a, 1 and Gabriel ValienteE-mail The Corresponding Author, b, 2

a Computer Science Department, University of Oriente, 90900, Santiago de Cuba, Cuba b Department of Software, Technical University of Catalonia, E-08034 Barcelona, Spain

Received 22 May 2000;
revised 30 November 2000.
Available online 11 April 2001.

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Abstract

The relationship between two important problems in pattern recognition using attributed relational graphs, the maximum common subgraph and the minimum common supergraph of two graphs, is established by means of simple constructions, which allow to obtain the maximum common subgraph from the minimum common supergraph, and vice versa. On this basis, a new graph distance metric is proposed for measuring similarities between objects represented by attributed relational graphs. The proposed metric can be computed by a straightforward extension of any algorithm that implements error-correcting graph matching, when run under an appropriate cost function, and the extension only takes time linear in the size of the graphs.

Author Keywords: Optimal graph matching; Error-correcting graph matching; Attributed relational graph; Graph edit distance; Subgraph isomorphism; Maximum common subgraph; Minimum common supergraph

1 Partially supported by the Instituto de Cooperación Iberoamericana.

2 Partially supported by the Spanish DGES project PB96-0191-C02-02 and CICYT project TIC98-0949-C02-01 HEMOSS.

Corresponding Author Contact Information Corresponding author. Fax: +53-226-3-26-89; email: mirtha@csd.uo.edu.cu


 
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