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Journal of Systems and Software
Volume 57, Issue 2, 15 June 2001, Pages 145-154
 
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doi:10.1016/S0164-1212(00)00124-2    How to Cite or Link Using DOI (Opens New Window)
Copyright © 2001 Elsevier Science Inc. All rights reserved.

Non-linear array data dependence test

Tsung-Chuan HuangCorresponding Author Contact Information, E-mail The Corresponding Author and Cheng-Ming Yang

Department of Electrical Engineering, National Sun Yat-Sen University, 70 Lian-Hai Road, Kaohsiung 804, Taiwan, ROC

Received 20 December 1999;
revised 1 May 2000;
accepted 18 May 2000
Available online 7 June 2001.

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Abstract

Data dependence analysis is the most essential process while parallelizing a sequential program. Most current data dependence tests cannot handle array subscripts that are non-linear expressions. In this paper, we present a new parallelization algorithm, called non-linear array subscripts (NLA) test, to deal with non-linear or complex array subscripts. In this scheme, the iterations subject to loop-carried dependence are scheduled into different wavefronts, while the iterations with no loop-carried dependence are assigned into the same wavefront. Based on the wavefront information, the original loop is then transformed into parallel code. Our experimental results on shared-memory parallel machines HP SPP2000 and ALR Quad6 prove the high effectiveness of the NLA test.

Author Keywords: Data dependence test; Non-linear array subscripts; Parallelizing compiler

Article Outline

1. Introduction
2. Data dependence
3. The NLA test
4. Illustration of NLA test
5. Examples
6. Experimental results
6.1. Evaluation for artificial synthetic loops
6.2. Evaluation for real programs
7. The barrier overheads of NLA test
8. Conclusions
References
Vitae









 
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