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Pattern Recognition
Volume 35, Issue 2, February 2002, Pages 361-371
 
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doi:10.1016/S0031-3203(01)00049-8    How to Cite or Link Using DOI (Opens New Window)
Copyright © 2001 Pattern Recognition Society. Published by Elsevier Science B.V.

Line segment Hausdorff distance on face matching

Yongsheng GaoCorresponding Author Contact Information, E-mail The Corresponding Author and Maylor K. H. LeungE-mail The Corresponding Author

School of Computer Engineering, Nanyang Technological University, Singapore 639798, Singapore

Received 17 March 2000;
revised 28 November 2000;
accepted 28 November 2000
Available online 26 November 2001.

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Abstract

A novel concept of line segment Hausdorff distance is proposed in this paper. Researchers apply Hausdorff distance to measure the similarity of two point sets. It is extended here to match two sets of line segments. The new approach has the advantage to incorporate structural and spatial information to compute the similarity. The added information can conceptually provide more and better distinctive capability for recognition. This would strengthen and enhance the matching process of similar objects such as faces. The proposed technique has been applied online segments generated from the edge maps of faces with encouraging result that supports the concept experimentally. The results also implicate that line segments could provide sufficient information for face recognition. This might imply a new way for face coding and recognition.

Author Keywords: Line segment Hausdorff distance; Hausdorff distance; Line segment; Structure; Disparity; Face recognition

Article Outline

1. Introduction
2. Hausdorff distance
3. Line segment Hausdorff distance
4. Experimental results
4.1. The effect of Wa
4.2. Face recognition
4.3. Face recognition with lighting changes
4.4. Face recognition under facial expression changes
4.5. Leave-one-out test
4.6. Storage requirement and computational complexity
5. Conclusion
References
Further Reading
Vitae






















Pattern Recognition
Volume 35, Issue 2, February 2002, Pages 361-371
 
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