Influence of substrate texture on microstructure and photovoltaic performances of thin film polycrystalline silicon solar cells
Introduction
Intrinsic polycrystalline silicon (poly-Si) thin films have gathered a great deal attention as a promising photovoltaic material for a stable and highly efficient solar cell [1], [2], [3], [4], [5]. Since poly-Si is an indirect band gap material and has low optical absorption coefficient in visible-infrared region, the light trapping in poly-Si layer by textured substrate is one of the most important technical issues for achievement of high short circuit current. However, one needs to take into account the influence of substrate texture not only on the light trapping but also on poly-Si microstructure, because the substrate surface morphology dominates the preferential growth of poly-Si photovoltaic layer [5]. So far, only few studies have been examined for the optimum design of substrate texture to realize further improvement of the photovoltaic performances of poly-Si solar cells [1], [5].
For amorphous silicon solar cells, textured SnO2 has been widely used as a front transparent conductive oxide (TCO) layer due to its controllability of surface morphology as well as good light trapping performance [6]. We expect that the textured SnO2 could be utilized for the light trapping even in the substrate-type poly-Si solar cells as a novel back reflector with a structure of ZnO/Ag/SnO2 triple layers.
In this work, a series of the poly-Si solar cells has been fabricated on differently textured ZnO/Ag/SnO2/glass substrates and investigated concerning the influence of substrate texture on microstructure and photovoltaic performances. It has been demonstrated that the poly-Si microstructure strongly depends on the substrate surface morphology. Based on these results, we will discuss the correlation between poly-Si microstructure and transport properties in the poly-Si photovoltaic layer as a function of root mean square (RMS) roughness of substrate surface.
Section snippets
Experimental
We fabricated substrate-type poly-Si solar cells with a structure of Ag-grid/indium tin oxide (ITO)/p–i–n/back reflector/glass. A series of four substrates of different surface texture was prepared and then used as the back reflector of poly-Si solar cells. For these substrates, a highly reflective ZnO(1000 Å)/Ag(2000 Å) double layer was formed on differently textured SnO2(8000 Å)/glass substrates (Asahi Glass Company). For comparison, ZnO/Ag/glass was also prepared as a flat substrate.
The
Results
Fig. 1 represents the roughness height distributions of the back reflectors used in this experiment, in which (a) corresponds to the surface of flat ZnO/Ag/glass and (b)–(e) correspond to that of textured ZnO/Ag/SnO2/glass. The roughness height distribution of each substrate is well fitted by Gaussian function with different peak centers and standard deviations. The RMS roughness, σ, of these substrates are estimated as (a) 26 nm, (b) 34 nm, (c) 38 nm, (d) 46 nm and (e) 55 nm, respectively.
Discussion
As already mentioned in Section 1, the performance of back reflector plays an important role in obtaining high short circuit current of poly-Si solar cells. The key requirement for the back reflector is to realize the sufficient light trapping to enhance the path length of the incident light in thin film poly-Si photovoltaic layer, and reduce the weak-absorbable light getting out from the surface of solar cell. Although the highly textured ZnO/Ag/SnO2 back reflector shows the excellent light
Conclusions
Although the highly textured back reflector shows excellent light trapping properties, it tends to deteriorate the poly-Si (2 2 0) preferential growth, yielding poor photovoltaic performances. When the RMS roughness of substrate increases over 38 nm, pronounced reduction in carrier diffusion length is observed, which is the main cause for low Jsc and Voc. In this experiment, the textured ZnO/Ag/SnO2/glass substrate with RMS roughness of 38 nm is found to be most suitable for poly-Si solar cells,
Acknowledgements
The authors thank the members of Asahi Glass Company for preparation of substrates.
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