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Pattern Recognition Letters
Volume 17, Issue 3, 6 March 1996, Pages 263-276
 
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doi:10.1016/0167-8655(95)00115-8    How to Cite or Link Using DOI (Opens New Window)
Copyright © 1996 Published by Elsevier B.V.

A Bayesian compatibility model for graph matching

Richard C. Wilson and Edwin R. Hancock

Department of Computer Science, University of York, York, Y01 5DD United Kingdom

Received 10 May 1995; 
revised 2 October 1995. 
Available online 12 February 1999.

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Abstract

This letter presents a new methodology for determining the compatibility coefficients required for performing graph matching by probabilistic relaxation. The adopted framework is Bayesian and commences by specifying the effects of segmentation errors in corrupting the connectivity structure or topology of the graphs under match. This model of relational constraint corruption leads to a pattern of compatibility coefficients that is completely determined by the global topological properties of the graphs under match. We illustrate the application of this new theory in two graph matching applications. The first of these is concerned with exploiting constraints provided by edges. Here the compatibility coefficient for consistent edges is equal to the inverse edge-density. Our second illustration extends the compatibility model to the level of graph faces; the required coefficients are again parameter-free. We provide experimental validation of our method in the matching of aerial images. Here we demonstrate that the theoretical values of our compatibility coefficients are close to their experimentally optimal values.


Pattern Recognition Letters
Volume 17, Issue 3, 6 March 1996, Pages 263-276
 
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