Since digital fault simulation is a costly process, it is important to use very efficient techniques to perform this function. To this end, this study suggests that parallel fault simulators couldbe implemented with a new fault-simulation technique, called MNFP (multiple number of faults per pass). The technique intends to partition the total fault set into a number of fault groups which can be simulated as multiple faults. The fault group mentioned above should be structured such that ‘a test that detects any single fault in the group will detect the group, and conversely, a test that detects a group will detect at least one single fault in the group’. Thus, an initial attempt is made to detect a faulty group, then the single faults inside the group are located. During the required fault-partitioning process, such erratic phenomena as fault-masking effects and fictitious multiple-fault generation must be eliminated for the fault groups to have the required property. Two approaches to fault partitioning are made for this technique of fault simulation: PFP (probabilistic fault partitioning) and MFP (modular fault partitioning). Significant savings in simulation time are expected to be realized from the MNFP technique of fault simulation.