ScienceDirect® Home Skip Main Navigation Links
You have guest access to ScienceDirect. Find out more.
 
Home
Browse
My Settings
Alerts
Help
 Quick Search
 Search tips (Opens new window)
    Clear all fields    
 
Font Size: Decrease Font Size  Increase Font Size
 Abstract - selected
Purchase PDF (518 K)

Article Toolbox
  E-mail Article   
  Add to my Quick Links   
Bookmark and share in 2collab (opens in new window)
Request permission to reuse this article
  Cited By in Scopus (0)
 
 
 
Related Articles in ScienceDirect
View More Related Articles
 
View Record in Scopus
 
doi:10.1016/0165-6074(88)90339-0    
How to Cite or Link Using DOI (Opens New Window)

Copyright © 1988 Published by Elsevier Science B. V.

Parallelism extraction from sequential programs for VLSI applications

Purchase the full-text article



References and further reading may be available for this article. To view references and further reading you must purchase this article.

Krzysztof Kuchcinski and Zebo Peng

Dept. of Computer and Information Science Linköping University S-581 83, Linköping, Sweden


Available online 14 August 2003.

Abstract

The paper describes a new approach for automatic extraction of parallelism from sequential programs. The proposed method translates first the sequential programs to their intermediate ETPN (extended timed Petri net) representation and then extracts parallel operations by data dependency analysis. The data dependency analysis is carried out iteratively using interval partitioning and place composition techniques so as to reduce the extraction algorithm complexity. The parallel algorithms produced by the extraction process can then be optimized and improved by an iterative improvement algorithm driven by an optimization strategy and finally implemented directly in VLSI.

Article Outline

• References

 
Home
Browse
My Settings
Alerts
Help
Elsevier.com (Opens new window)
About ScienceDirect  |  Contact Us  |  Information for Advertisers  |  Terms & Conditions  |  Privacy Policy
Copyright © 2008 Elsevier B.V. All rights reserved. ScienceDirect® is a registered trademark of Elsevier B.V.