ScienceDirect® Home Skip Main Navigation Links
You have guest access to ScienceDirect. Find out more.
 
Home
Browse
My Settings
Alerts
Help
 Quick Search
 Search tips (Opens new window)
    Clear all fields    
advertisementadvertisement
Wear
Volume 195, Issues 1-2, July 1996, Pages 148-151
 
Font Size: Decrease Font Size  Increase Font Size
 Abstract - selected
Purchase PDF (375 K)

 
 
 
Related Articles in ScienceDirect
View More Related Articles
 
View Record in Scopus
 
doi:10.1016/0043-1648(95)06814-7    How to Cite or Link Using DOI (Opens New Window)
Copyright © 1996 Published by Elsevier Science B.V.

Measurement of surface finish using an optical diffraction technique

S. Ramesh and B. RamamoorthyCorresponding Author Contact Information

Manufacturing Engineering Section, Department of Mechanical Engineering, Indian Institute of Technology, Madras 600036, India

Received 30 May 1995; 
accepted 5 October 1995. 
Available online 15 February 1999.

Purchase the full-text article



References and further reading may be available for this article. To view references and further reading you must purchase this article.

Abstract

In recent years there has been considerable growth in the use of optical methods for evaluating surfaces. Conventional stylus techniques, though powerful, have their own limitations. These include the resolution of the stylus, and the damage caused by the moving diamond stylus when tracing profiles on soft materials. Hence non-contact methods of measuring surface finish of often required. One approach in this direction is the use of an optical diffraction technique. The unique properties of the diffraction phenomenon make this technique useful and the validity of this technique in the evaluation of surface finish is investigated in this paper.

Author Keywords: Roughness; Diffraction; Stylus measurement; Graphical filtering

Article Outline

• References

Wear
Volume 195, Issues 1-2, July 1996, Pages 148-151
 
Home
Browse
My Settings
Alerts
Help
Elsevier.com (Opens new window)
About ScienceDirect  |  Contact Us  |  Information for Advertisers  |  Terms & Conditions  |  Privacy Policy
Copyright © 2008 Elsevier B.V. All rights reserved. ScienceDirect® is a registered trademark of Elsevier B.V.