Infrared temperature measurement with automatic correction of the influence of emissivity

doi:10.1016/0020-0891(89)90051-1

Infrared Physics

Volume 29, Issues 2–4, May 1989, Pages 211-212

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Abstract

Multispectral infrared (3–13 μm) radiance measurement of an object in 10 narrow spectral bands is performed. Via a balancing calculation the measured data lead to the temperature of the object, its spectral emissivity and the temperature of the object's environment. Also temperatures below 973 K of highly reflecting surfaces (emissivity 0.03⩽ ϵ ⩽ 0.2) can be determined.

References (4)

R. Zurmühl
Praktische Mathematik für Ingenieure und Physiker
(1961)
V. Tank, German patent DE 3115887 C2...

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The infrared normal spectral emissivity of microstructured silicon prepared by femtosecond laser irradiation in SF₆ was measured for the wavelength range 2.5 μm to 25 μm. Greatly enhanced emissivity compared to that of flat silicon was observed over the entire wavelength range. For a sample with 13–14 μm high spikes, the emissivity at a temperature of 100 °C is approximately 0.96. The emissivity decreases slightly in the wavelength region above 8 μm, but remains higher than 0.9 over most of the measured wavelength range. Also the average emissivity is less than Nextel- Velvet-811-21 Coating, it can be used stably at more wide temperatures from 100 °C to 400 °C. These results show the potential for microstructured silicon to be used as a flat blackbody source or silicon-based pyroelectric and microbolometer devices.
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Various metallic samples have been studied (steels (316L, 304L, 316Ti), titanium), and results are given for temperature ranges between 600 K and 1000 K. Another approach has been proposed by Tank [21–23] who used a “staircase” approximation, with the only hypothesis that emissivity is constant over each spectral step. Some criterion given by Gathers have been found again [18]:
A device for non-intrusive temperature measurements of metallic materials has been developed. Moreover, as the emissive properties of the metal cannot be known a priori, multiwavelength pyrometry was used to address this issue in the following way:
- – Simultaneous measurement of thermal emission at N wavelengths.
- – Use technique of parameter identification including a physical or an empirical model for the emissivity to determine temperature and spectral emissivity.
This method was applied to a temperature range between 500 K and the melting/solidification point of the metallic materials. The results obtained in visible and infrared spectral range were compared. Various metallic samples were studied (steels, titanium), and for each sample, the relative deviation between identified and experimental (thermocouple) temperatures is lower than 2%, using the more suitable models. For some groups of materials (austenitic stainless steels, and carbon steels), one or several models giving suitable results for similar samples were selected.
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We present here a preliminary study concerning a multi-wavelength pyrometry method. This technique may be useful for temperature measurements on materials of unknown, selective, rapidly varying emissivity. From a (simultaneous) measurement of the thermal emission at N wavelengths, a fitting procedure leads to the simultaneous identification of the temperature and the spectral emissivity. We present first a comprehensive discussion of the various parameters influencing the accuracy of the method. Then a number of simulated experiments are calculated in order to test the efficiency of various emissivity models and to estimate the robustness of the method. It appears that measurements in the (thermal) infrared spectral range may yield satisfying temperature measurements down to T = 600 K.
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^☆: Developed in cooperation with: Lehrstuhl für Elektrische Meβtechnik, Technische Universität München, D-8000 München, West Germany.

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Infrared temperature measurement with automatic correction of the influence of emissivity☆

Abstract

Praktische Mathematik für Ingenieure und Physiker