Effect of solution molarity on the characteristics of vanadium pentoxide thin film
Introduction
Nowadays vanadium pentoxide films are of increasing interest due to their unique features, such as electro-chemical activity, high stability, good specific energy, special layer structure and high capacity as well as excellent thermoelectric property. It can be used as a gas sensor, cathode for solid-state batteries, window for solar cells and as an active material in electrochromic devices [1], [2]. There are many numbers of vanadium oxides and suboxides such as VO, V2O3, VO2, V4O9 and V2O5. Most of these oxides are metal–insulator transition, which occurs over a wide range of transition temperature depending on the O/V ratio. Vanadium pentoxide is the most stable compound of the V–O system [3]. Various methods are reported for the preparation of V2O5 thin films such as vacuum evaporation [4], [5], RF sputtering [2], chemical vapour deposition [6], electron beam evaporation [7] and pulsed laser deposition (PLD) [8]. However, the deposition of thin film from sprayed solution catch the attention of researchers because of such method has low-cost set-up and has the ability to deposit large area [9]. In this work, the synthesis of V2O5 films by spray pyrolysis technique was investigated at different concentrations of spray solution at constant substrate temperature. The influence of solution molarity on the characteristics (microstructures, optical and electrical properties) of V2O5 thin film is reported.
Section snippets
Experimental details
At constant temperature, different concentrations of vanadium nitrate [V(NO3)5·5H2O] namely 0.1, 0.2, 0.3, 0.4 and 0.5 M were sprayed on preheated amorphous glass substrates. The substrates have been chemically and ultrasonically pre-cleaned. In order to get uniform thin films, a suitable condition for the height of the spraying nozzle, the flow rate and the deposition time are chosen and kept unchanged during the deposition process at 27 cm, 5 cm3 min−1 and 45 s, respectively. Also, a compressed
Structural characterization
Fig. 1 shows the X-ray diffraction (XRD) patterns for samples prepared at Tsub = 350 °C with different solution molarities, namely 0.1, 0.2, 0.3, 0.4 and 0.5 M. The peaks are indexed in comparing our experimental data with the ASTM cards of X-ray powder. The produced data for all films prepared at different molarities of spray solution showed a good agreement with the data of V2O5 powder file (JCPDS data number 09-0387) which corresponding to the orthorhombic crystalline structure. Indeed, the
Conclusions
In the present investigation vanadium pentoxide films deposited by spray pyrolysis at different solution molarities exhibit some interesting microstructural, optical and electrical properties. The X-ray diffraction (XRD) revealed that, the prepared films at solution molarity ≥0.1 M and Tsub = 350 °C was polycrystalline orthorhombic structure with a preferential orientation along 〈0 0 1〉 direction. The values of crystallite size increased with increasing solution molarity from 0.1 to 0.4 M.
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