Using electron beams to investigate catalytic materials

Bingsen Zhang; Dang Sheng Su

doi:10.1016/j.crhy.2013.11.001

Electron microscopy / Microscopie électronique

Using electron beams to investigate catalytic materials
[Apports de la microscopie électronique à l'étude des matériaux catalytiques]

Bingsen Zhang ¹ ; Dang Sheng Su ^1,²

¹ Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, Shenyang 110016, China
² Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Faradayweg 4–6, 14195 Berlin, Germany

Comptes Rendus. Physique, Volume 15 (2014) no. 2-3, pp. 258-268.

Résumé
Abstract

Le microscope électronique à transmission (TEM) permet, non seulement de révéler la morphologie, mais aussi d'apporter des informations à l'échelle atomique sur les propriétés structurales, chimiques et électroniques de catalyseurs solides. Ceci en fait un outil majeur dans le développement de la catalyse hétérogène. Presque tous les matériaux catalytiques ont été étudiés par TEM afin de caractériser leur structure, ce qui aide considérablement à la recherche des relations synthèse–structure–propriétés, ainsi qu'à la production de nouveaux matériaux aux propriétés ciblées. Dans cette revue, plusieurs exemples ont été sélectionnés pour illustrer les méthodes et les résultats de l'étude des matériaux catalytiques, lorsque le faisceau d'électrons d'un TEM est utilisé comme faisceau sonde.

Electron microscopy (EM) enables us, not only to reveal the morphology, but also to provide structural, chemical and electronic information about solid catalysts at the atomic level, providing a dramatic driving force for the development of heterogeneous catalysis. Almost all catalytic materials have been studied with EM in order to obtain information about their structures, which can help us to establish the synthesis–structure–property relationships and to design catalysts with new structures and desired properties. Herein, several examples will be reviewed to illustrate the investigation of catalytic materials by using electron beams.

Publié le : 2014-01-28

DOI : 10.1016/j.crhy.2013.11.001

Keywords: Electron microscopy, Catalyst, Chemical composition, Surface, Dynamic process, Particle shape
Mot clés : Microscopie électronique, Catalyseur, Composition chimique, Surface, Processus dynamique, Forme des particules

Affiliations des auteurs :

Bingsen Zhang ¹ ; Dang Sheng Su ^{1, 2}

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     author = {Bingsen Zhang and Dang Sheng Su},
     title = {Using electron beams to investigate catalytic materials},
     journal = {Comptes Rendus. Physique},
     pages = {258--268},
     publisher = {Elsevier},
     volume = {15},
     number = {2-3},
     year = {2014},
     doi = {10.1016/j.crhy.2013.11.001},
     language = {en},
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Bingsen Zhang; Dang Sheng Su. Using electron beams to investigate catalytic materials. Comptes Rendus. Physique, Volume 15 (2014) no. 2-3, pp. 258-268. doi : 10.1016/j.crhy.2013.11.001. https://comptes-rendus.academie-sciences.fr/physique/articles/10.1016/j.crhy.2013.11.001/

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