High-resolution transmission electron microscopy study on SiC grown from SiO and C*: crystal growth and structural characterization
Reference (15)
- et al.
J. Catalysis
(1988) Ultramicroscopy
(1987)- M. Ledoux, J. Guille, S. Hantzer and D. Dubots, Euro Patent No....
- M. Benaissa, E. Peschiera, J. Werckmann, J. Guille, M. Prin, G. Ehret and M. Ledoux, to be...
- et al.
- et al.
J. Microsc. Spectrosc. Electron.
(1982) - et al.
Acta Cryst. A
(1981)
There are more references available in the full text version of this article.
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