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SiC/Mg multilayer reflective mirror for He-II radiation at 30.4 nm and its thermal stability

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Abstract

In applications of solar physics, extreme ultraviolet imaging of solar corona by selecting the He-II (λ = 30.4 nm) emission line requires high reflectivity multilayer mirrors. Some material combinations were studied to design the mirrors working at a wavelength of 30.4 nm, including SiC/Mg, B4C/Mg, C/Mg, C/Al, Mo/Si, B4C/Si, SiC/Si, C/Si, and Sc/Si. Based on optimization of the largest reflectivity and the narrowest width for the multilayer mirror, a SiC/Mg material combination was selected as the mirror and fabricated by a magnetron sputtering system. The layer thicknesses of the SiC/Mg multilayer were measured by an X-ray diffractometer.

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References

  1. Ravet M F, Bridou F, Zhang-Song X, et al. Ion beam deposited Mo/Si multilayers for EUV imaging applications in astrophysics. Proceedings of SPIE, 2004, 5250: 99–108

    Article  Google Scholar 

  2. Gardner L, Kohl J, Cranmer S, et al. The advanced solar coronal explorer mission (ASCE). Proceedings of SPIE, 1999, 3764: 134–146

    Article  Google Scholar 

  3. Grigonis M, Knystautas E J. C/Si multilayer mirrors for the 25–30 nm wavelength region. Applied Optics, 1997, 36(13): 2839–2842

    Article  Google Scholar 

  4. Zhang Z, Wang Z S, Qin S J, et al. The design of X-ray supermirror with broad angle range. Acta Photonica Sinica, 2003, 32(2): 253–256 (in Chinese)

    Google Scholar 

  5. Vial J C, Song X Y, Lemaire P, et al. The solar high-resolution imager-coronagraph LYOT mission. Proceedings of SPIE, 2003, 4853: 479–489

    Article  Google Scholar 

  6. Windt D L, Donguy S, Seely J F, et al. EUV multilayers for solar physics. Proceedings of SPIE, 2004, 5168: 1–11

    Article  Google Scholar 

  7. Wang F L, Wang Z S, Qin S J, et al. Investigation of ultra-short-period W/C multilayers for soft X-ray optics. Chinese Optics Letters, 2005, 3(7): 425–427

    MathSciNet  Google Scholar 

  8. Zhang Z, Wang Z S, Wang F L, et al. Design and fabrication of broad angular range depth-graded C/W multilayer mirror for hard X-ray optics. Chinese Optics Letters, 2005, 3(7): 422–424

    Google Scholar 

  9. Chen B, Ni Q L, Cao J H, et al. Development of a space soft X-ray and EUV normal incidence telescope. Optics and Precision Engineering, 2003, 11(4): 315–319 (in Chinese)

    Google Scholar 

  10. Wang Z S, Zhang S M, Wu W J, et al. B4C/Mo/Si high reflectivity multilayer mirror at 30.4 nm. Chinese Optics Letters, 2006, 4(10): 611–613

    Google Scholar 

  11. Wang Z S, Wang H C, Zhu J T, et al. Broad angular multilayer analyzer for soft X-rays, Optics Express, 2006, 14(6): 2533–2538

    Article  Google Scholar 

  12. Wang Z S, Wang H C, Zhu J T, et al. Broadband multilayer polarizers for the extreme ultraviolet. Journal of Applied Physics, 2006, 99(5): 056108

    Article  Google Scholar 

  13. Wang Z S, Wang H C, Zhu J T, et al. Extreme ultraviolet broadband Mo/Y multilayer analyzers. Applied Physics Letters, 2006, 89(24): 241120

    Article  Google Scholar 

  14. Wang Z S, Wang H C, Zhu J T, et al. Broadband Mo/Si multilayer transmission phase retarders for the extreme ultraviolet. Applied Physics Letters, 2007, 90(3): 031901

    Article  Google Scholar 

  15. Wang H C, Zhu J T, Wang Z S, et al. Broadband Mo/Si multilayer analyzers for the 15–17 nm wavelength range. Thin Solid Films, 2006, 515(4): 2523–2526

    Article  Google Scholar 

  16. Spiller E. Reflective multilayer coatings for the far UV region. Applied Optics, 1976, 15(10): 2333–2338

    Article  Google Scholar 

  17. Wang Z S, Ma Y Y. Researches on extreme ultraviolet multilayers fabrication. Optical Technique, 2001, 27(6): 532–534 (in Chinese)

    MathSciNet  Google Scholar 

  18. Wang H C, Wang Z S, Qin S J, et al. Analysis of the reflectivity of Mo/Si multilayer film for soft X-ray. Acta Optica Sinica, 2003, 23(11): 1362–1365 (in Chinese)

    Google Scholar 

  19. Wang Z S. Effect of film thickness errors on performance of soft X-ray multilayer. Optics and Precision Engineering, 2003, 11(2): 136–138 (in Chinese)

    Google Scholar 

  20. Zhu J T, Wang Z S, Zhang S M, et al. High reflectivity multilayer mirror for He-II radiation at 30.4 nm in solar physics application, In: Optical Interference Coatings 2007, Tucson: Optical Society of America, 2007, FA9

    Google Scholar 

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Correspondence to Jingtao Zhu.

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Translated and revised from Acta Optica Sinica, 2007, 27(4): 735–738 [译自: 光学学报]

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Zhu, J., Xu, D., Zhang, S. et al. SiC/Mg multilayer reflective mirror for He-II radiation at 30.4 nm and its thermal stability. Front. Optoelectron. China 1, 305–308 (2008). https://doi.org/10.1007/s12200-008-0028-y

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  • DOI: https://doi.org/10.1007/s12200-008-0028-y

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