Abstract
In applications of solar physics, extreme ultraviolet imaging of solar corona by selecting the He-II (λ = 30.4 nm) emission line requires high reflectivity multilayer mirrors. Some material combinations were studied to design the mirrors working at a wavelength of 30.4 nm, including SiC/Mg, B4C/Mg, C/Mg, C/Al, Mo/Si, B4C/Si, SiC/Si, C/Si, and Sc/Si. Based on optimization of the largest reflectivity and the narrowest width for the multilayer mirror, a SiC/Mg material combination was selected as the mirror and fabricated by a magnetron sputtering system. The layer thicknesses of the SiC/Mg multilayer were measured by an X-ray diffractometer.
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Translated and revised from Acta Optica Sinica, 2007, 27(4): 735–738 [译自: 光学学报]
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Zhu, J., Xu, D., Zhang, S. et al. SiC/Mg multilayer reflective mirror for He-II radiation at 30.4 nm and its thermal stability. Front. Optoelectron. China 1, 305–308 (2008). https://doi.org/10.1007/s12200-008-0028-y
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DOI: https://doi.org/10.1007/s12200-008-0028-y