Abstract
This work strives to model the normal spectral emissivity of aluminum 1060 during the growth of oxide layer in air over the temperatures ranging from 800 to 910 K. For this reason, the normal spectral emissivity of aluminum 1060 has been measured over a 6 h heating period at a definite temperature. In our experiment, the radiance coming from the specimen is received by an InGaAs photodiode detector, which works at 1.5 μm with the bandwidth of 20 nm. The temperature of specimen surface is measured by averaging the two platinum-rhodium thermocouples, which are symmetrically welded in the front surface of specimen near the measuring area viewed by the detector. The strong oscillations of normal spectral emissivity have been observed and discussed, which are affirmed to be connected with the thickness of oxide layer on the specimen surface, and originate from the interference effect between the radiation coming from the oxide layer on the specimen surface and the radiation stemming from the substrate. The uncertainty of normal spectral emissivity contributed only by the surface oxidization is about 4.6-10.6%, and the corresponding uncertainty of temperature contributed only by the surface oxidization is about 3.5-8.4 K. The analytical model between the normal spectral emissivity and the heating time is evaluated at a definite temperature. A simple functional form with the exponential and logarithmic functions can be employed to reproduce well the variation of normal spectral emissivity with the heating time at a definite temperature, including the reproduction of strong oscillations.
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Abbreviations
- ελ :
-
Normal spectral emissivity
- λ:
-
Working wavelength of the optical receiving system
- T :
-
Surface temperature of aluminum 1060 specimen
- D :
-
Aperture diameter of the optical receiving system
- f’:
-
Focal length of the optical receiving system
- τ0 :
-
Propagation coefficient of the atmosphere
- A :
-
Area of the sensitive unit of the detector
- λ1, λ2 :
-
Spectral limits of the optical receiving system used to select the spectral band
- Δλ:
-
Bandwidth of the interference filter
- τλ :
-
Total transmissivity of the optical receiving system
- L λ,b :
-
Spectral radiance of a perfect blackbody emitter
- h :
-
Planck constant
- c :
-
Speed of light
- k :
-
Boltzmann constant
- P 1 :
-
Radiance coming from a perfect blackbody emitter at λ and T
- P 1’:
-
Output of the optical receiving system, corresponding to P 1
- P 2 :
-
Radiance coming from a real surface at λ and T
- P 2′:
-
Output of the optical receiving system, corresponding to P 2
- m :
-
An integer
- d :
-
Apparent oxidation film thickness, which is equal to real thickness of oxidation film multiplied by the steel oxidation layer refractive index
- a 1, a 2, a 3, a 4, a 5 :
-
Coefficients in the spectral emissivity model
- t :
-
Heating time in min from the heating start
- E RMSE :
-
Root-mean-square error
- R :
-
Correlation coefficient
- c 2 :
-
Second thermal radiation constant
- ΔT :
-
Temperature uncertainty
- Δɛλ/ɛλ :
-
Measurement uncertainty of the spectral emissivity
- β:
-
Responding function of the InGaAs photodiode detector
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Acknowledgments
This work was sponsored by the National Natural Science Foundation of China under the Grant Nos. 61077073 and 61177092, the Program for Science and Technology Innovation Talents in Universities of Henan Province in China under Grant No. 2008HASTIT008, and the Key Program for Science and Technology Foundation of Henan Province in China under Grant No. 102102210072.
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Shi, D., Zou, F., Zhu, Z. et al. Modeling the Normal Spectral Emissivity of Aluminum 1060 at 800-910 K During the Growth of Oxide Layer. J. of Materi Eng and Perform 24, 1718–1725 (2015). https://doi.org/10.1007/s11665-015-1407-3
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DOI: https://doi.org/10.1007/s11665-015-1407-3