Surface x-ray diffraction was employed, in situ, to measure the GaSb(001)-(1 × 5) and (1 × 3) surface phases under technologically relevant growth conditions. We measured a large set of fractional-order in-plane diffraction peaks arising from the superstructure of the surface reconstruction. From the data we calculated two-dimensional (2D) Patterson functions, the peaks of which represent inter-atomic distances weighted by the number of electrons in the individual atoms. For the (1 × 3) phase we obtained good agreement between our data and the β(4 × 3) model proposed in recent experimental and theoretical work. Our measurements on the Sb-rich (1× 5) phase provide evidence that the structure under growth conditions is, in fact, different from that of the models previously suggested on the basis of scanning tunneling microscopy (STM). We discuss reasons for this discrepancy as well as the identified structural elements for these reconstructions, which include surface relaxations and subsurface rearrangement.
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A.S. Bracker, M.J. Yang, B.R. Bennett, J.C. Culbertson, and W.J. Moore. J. Cryst, Growth 220, 384 (2000). doi:10.1016/S0022-0248(00)00871-X
L.J. Whitman, P.M. Thibado, S.C. Erwin, B.R. Bennett, and B.V. Shanabrook, Phys. Rev. Lett. 79, 693 (1997). doi:10.1103/PhysRevLett.79.693
J. Houze, S. Kim, S.-G. Kim, S.C. Erwin, and L.J. Whitman, Phys. Rev. B 76, 205303 (2007). doi:10.1103/PhysRevB.76.205303
M.D. Pashley, Phys. Rev. B 40, 10481 (1989). doi:10.1103/PhysRevB.40.10481
W. Barvosa-Carter, A.S.Bracker, J.C. Culbertson, B.Z.Nosho, B.V. Shanabrook, L.J. Whitman, H. Kim, N.A. Modine, and E. Kaxiras. Phys. Rev. Lett. 84, 4649 (2000). doi:10.1103/PhysRevLett.84.4649
M.T. Sieger, T. Miller, and T.C. Chiang, Phys. Rev. B 52, 8256 (1995). doi:10.1103/PhysRevB.52.8256
K. Chuasiripattana and G.P. Srivastava, Surf. Sci. 600, 3803 (2006). doi:10.1016/j.susc.2005.12.074
M.C. Righi, R. Magri, and C.M. Bertoni, Phys. Rev. B 71, 075323 (2005). doi:10.1103/PhysRevB.71.075323
M. Takahasi, Y. Yoneda, H. Inoue, N. Yamamoto, and J. Mizuki, Jpn. J. Appl. Phys. 41, 6247 (2002). doi:10.1143/JJAP.41.6247
B.P. Tinkham, W. Braun, V.M. Kaganer, D.K. Satapathy, B. Jenichen, and K.H. Ploog, Surf. Sci. 601, 814 (2007). doi:10.1016/j.susc.2006.11.030
E. Vlieg, J. Appl. Cryst. 31, 198 (1998). doi:10.1107/S0021889897009990
M. Takahasi, Y. Yoneda, N. Yamamoto, and J. Mizuki, Phys. Rev. B 68, 085321 (2003). doi:10.1103/PhysRevB.68.085321
I.K. Robinson, and D.J. Tweet, Rep. Prog. Phys. 55, 599 (1992). doi:10.1088/0034-4885/55/5/002
H.X. Gao and L.M. Peng, Acta Crystallogr. A 55, 926 (1999). doi:10.1107/S0108767399005176
Acknowledgements
This work was supported by the Deutsche Forschungsgemeinschaft (SFG 296). We would like to thank Bernd Jenichen and Vladimir Kaganer for helpful discussions, and B.P.T would like to thank the Alexander von Humboldt Foundation for its support. The synchrotron radiation experiments were performed at SPring-8 with the approval of the Japan Atomic Energy Agency (JAEA) and the Japan Synchrotron Radiation Research Institute (JASRI) as Nanotechnology Support Project of the Ministry␣of Education, Culture, Sports, Science and Technology (Proposal No. 2006A1600).
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Tinkham, B., Romanyuk, O., Braun, W. et al. GaSb(001) Surface Reconstructions Measured at the Growth Front by Surface X-ray Diffraction. J. Electron. Mater. 37, 1793–1798 (2008). https://doi.org/10.1007/s11664-008-0557-6
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DOI: https://doi.org/10.1007/s11664-008-0557-6