Skip to main content
Log in

An Investigation of Microstructure and Microhardness of Sn-Cu and Sn-Ag Solders as Functions of Alloy Composition and Cooling Rate

  • Published:
Journal of Electronic Materials Aims and scope Submit manuscript

Abstract

The microstructure and microhardness of Sn-xAg and Sn-xCu solders were investigated as functions of alloy composition and cooling rate. The Ag compositions examined varied from 0.5 wt.% to 3.5 wt.%, while Cu varied from 0.5 wt.% to 2.0 wt.%. Three cooling rates were employed during solidification: 0.02°C/s (furnace cooling), about 10°C/s (air cooling), and 100°C/s or higher (rapid solidification). Sn grain size and orientation were observed by cross-polarization light microscopy and electron-backscattering diffraction (EBSD) techniques. The microhardness was measured to correlate the mechanical properties with alloy compositions and cooling rates. From this study, it was found that both alloy composition and cooling rate can significantly affect the Sn grain size and hardness in Sn-rich solders. The critical factors that affect the microstructure–property relationships of Sn-rich solders are discussed, including grain size, crystal orientation, dendrite cells, twin boundaries, and intermetallic compounds (IMC).

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. S.K. Kang, A.K. Sarkhel. J. Electron. Mater. 23, 701 (1994) doi:10.1007/BF02651362

    Article  ADS  CAS  Google Scholar 

  2. S.W. Jeong, J.H. Kim, H.M. Lee. J. Electron. Mater. 33, 1530 (2004) doi:10.1007/s11664-004-0095-9

    Article  ADS  CAS  Google Scholar 

  3. S.K. Kang, W.K. Choi, D.-Y. Shih, D.W. Henderson, T. Gosselin, A. Sarkhel, C. Goldsmith, and K.J. Puttlitz, Proc. 53rd Electronic Components and Technology Conf. (Piscataway, NJ: IEEE, 2003), pp. 64–70.

  4. S.K. Kang, W.K. Choi, D.-Y. Shih, D.W. Henderson, T. Gosselin, A. Sarkhel, C. Goldsmith, and K.J. Puttlitz, JOM 55, 61 (2003) doi:10.1007/s11837-003-0143-6

    Article  CAS  Google Scholar 

  5. E. Laine, E. Perfecto, B. Campbell, J. Wood, J. Busby, J.␣Garant, and L. Guerin, Proc. 57th Electronic Components and Technology Conf. (Piscataway, NJ: IEEE, 2007), pp. 1320–1325.

  6. S. Ishikawa, T. Uchiyama, E. Hashino, T. Kohno, M. Tanaka, and K. Tatsumi, Proc. 57th Electronic Components and Technology Conf. (Piscataway, NJ: IEEE, 2007), pp. 872–877.

  7. D. Kim, D. Suh, T. Millard, H. Kim, C. Kumar, M. Zhu, and Y. Xu, Proc. 57th Electronic Components and Technology Conf. (Piscataway, NJ: IEEE, 2007), pp. 1614–1619.

  8. M. Uchida, H. Ito, K. Yabui, H. Nishiuchi, T. Togasaki, K. Higuchi, and H. Ezawa, Proc. 57th Electronic Components and Technology Conf. (Piscataway, NJ: IEEE, 2007), pp. 885–891.

  9. T.R. Bieler, H. Jiang, L.P. Lehman, T. Kirkpatrick, and E.J. Cotts, Proc. 56th Electronic Components and Technology Conf. (Piscataway, NJ: IEEE, 2006), pp. 1462–1467.

  10. D.W. Hendrson, J.J. Woods, T.A. Gosselin, J. Bartelo, D.E. King, T.M. Korhonen, M.A. Korhonen, L.P. Lehman, E.J. Cotts, S.K. Kang, P. Lauro, D.-Y. Shih, C. Goldsmith, and K.J. Puttlitz, J. Mater. Res. 19, 1608 (2004) doi:10.1557/JMR.2004.0222

    Article  ADS  CAS  Google Scholar 

  11. L.P. Lehman, S.N. Athavale, T.Z. Fullem, A.C. Giamis, R.K. Kinyanjui, M. Lowenstein, K. Mather, R. Patel, D. Rae, J. Wang, Y. Xing, L. Zavalij, P. Borgensen, and E.J. cotts, J. Electron. Mater. 33, 1429 (2004) doi:10.1007/s11664-004-0083-0

    Article  ADS  CAS  Google Scholar 

  12. A. Lalonde, D. Emelander, J. Jeannette, C. Larson, W. Rietz, D. Swenson, and D.W. Henderson, J. Electron. Mater. 33, 1545 (2004) doi:10.1007/s11664-004-0096-8

    Article  ADS  CAS  Google Scholar 

  13. B. Sundman, B. Jansson, J.O. Andersson. Calphad 9, 153 (1985) doi:10.1016/0364-5916(85)90021-5

    Article  CAS  Google Scholar 

  14. U.R. Kattner, W.J. Boettinger. J. Electron. Mater. 23, 603 (1994) doi:10.1007/BF02653345

    Article  ADS  CAS  Google Scholar 

  15. J.-H. Shim, C.-S. Oh, B.-J. Lee, D.N. Lee. Z. Metallk. 87, 205 (1996)

    CAS  Google Scholar 

  16. G. Ghosh, Metab. Mater. Trans. A 30A, 1481 (1999). doi:10.1007/s11661-999-0085-x.

  17. A.U. Telang, T.R. Bieler, J.P. Lucas, K.N. Subramanian, L.P. Lehman, Y. Xing, and E.J. Cotts, J. Electron. Mater. 33, 1412 (2004) doi:10.1007/s11664-004-0081-2

    Article  ADS  CAS  Google Scholar 

  18. S.K. Kang, M.G. Cho, P. Lauro, D.-Y. Shih, Proc. 57th Electronic Components and Technology Conf. (Piscataway, NJ: IEEE, 2007), pp. 1597–1603.

  19. M.G. Cho, S.K. Kang, H.M. Lee. J. Mater. Res. 23, 1147 (2008) doi:10.1557/jmr.2008.0133

    Article  ADS  CAS  Google Scholar 

  20. S.K. Kang, M.G. Cho, D.-Y. Shih, S.-K. Seo, and H.M. Lee, Proc. 58th Electronic Components and Technology Conf. (Piscataway, NJ: IEEE, 2008), pp. 478–484.

  21. H.-J. Albrecht, A. Juritza, K. Muller, W.H. Muller, J. Sterthaus, J. Villain, and A. Vogliano, Proc. 5th Electronics Packaging Technology Conf. (Piscataway, NJ: IEEE, 2003), pp. 726–731.

Download references

Acknowledgement

This work was supported by the Center for Electronic Packaging Materials (ERC) of the MEST/KOSEF (Grant No. R11-2000-085-08006-0).

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Hyuck Mo Lee.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Seo, SK., Kang, S.K., Shih, DY. et al. An Investigation of Microstructure and Microhardness of Sn-Cu and Sn-Ag Solders as Functions of Alloy Composition and Cooling Rate. J. Electron. Mater. 38, 257–265 (2009). https://doi.org/10.1007/s11664-008-0545-x

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s11664-008-0545-x

Keywords

Navigation