Abstract
The performance of vacuum insulation panels (VIPs) is greatly determined by their internal vacuum, which is difficult to maintain constant for a long period of time, thus leading to their premature aging. This degradation is mainly caused by the underlying gas and moisture permeation under an extreme environment or from the residual material left inside during the manufacturing process. Hence, the development of smart pressure sensors capable of identifying minute fluctuations in the internal pressure at an initial stage is currently highly desirable in the industry. In the present study, the electrospinning technique was used for the fabrication of poly(vinylidene fluoride-trifluoroethylene) P(VDF-TrFE) and graphene-oxide-modified poly(vinylidene fluoride-trifluoroethylene) GO-P(VDF-TrFE) fiber membranes for piezoelectric pressure-sensing applications. The conventional interdigitated electrode was successfully deposited on the fibrous structure with high continuity in the fingers. The thermal stability and compatibility of the prepared structures were ascertained by performing the thermal characterization. The developed devices revealed high electric output when exposed to the pressure. The GO-P(VDF-TrFE) smart fiber-based device offered admirable response time (0.282 s) and high linearity of R2 = 0.99294, respectively. Our findings will lay a foundation for the establishment of future wireless smart structures capable of detecting small internal pressure (≤ 10 Pa) in many devices such as VIPs and other products even after their installation in building structures.
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Acknowledgements
This work was carried out under a joint project between Nanjing University of Aeronautics and Astronautics (NUAA), China, and the University of Victoria (UoV), Canada. The project (Grant No. SBZ2019000139) was titled as "Joint Research of Nano modified Ultra-fine Glass Fiber Core with Indulgent Pressure."
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Shahzad, A., Chen, Z., Haidary, A.A. et al. Piezoelectric pressure sensors based on GO-modified P(VDF-TrFE) fibers for vacuum applications. J Mater Sci: Mater Electron 31, 18627–18639 (2020). https://doi.org/10.1007/s10854-020-04405-4
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DOI: https://doi.org/10.1007/s10854-020-04405-4