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Damping properties of epoxy-based composite embedded with sol–gel-derived Pb(Zr0.53Ti0.47)O3 thin film annealed at different temperatures

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Abstract

Pb(Zr0.53Ti0.47)O3 (PZT) thin films were prepared on Pt/Ti/SiO2/Si substrate by sol–gel method. The effect of annealing temperature on microstructure, ferroelectric and dielectric properties of PZT films was investigated. When the films were annealed at 550–850 °C, the single-phase PZT films were obtained. PZT films annealed at 650–750 °C had better dielectric and ferroelectric properties. The sandwich composites with epoxy resin/PZT film with substrate/epoxy resin were prepared. The annealing temperature of PZT films influenced their damping properties, and the epoxy-based composites embedded with PZT film annealed at 700 °C had the largest damping loss factor of 0.923.

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Acknowledgments

This work was financed by the International Science and Technology Cooperation Program of China (Grant No. 2009DFB50470) and the Young Scientists Fund of the National Natural Science Foundation of China (Grant No. 50902108).

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Authors and Affiliations

  1. State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, and School of Materials Science and Engineering, Wuhan University of Technology, Wuhan, 430070, China

    Dongyun Guo, Wei Mao, Yan Qin, Zhixiong Huang, Chuanbin Wang, Qiang Shen & Lianmeng Zhang

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  1. Dongyun Guo
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  2. Wei Mao
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  3. Yan Qin
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  4. Zhixiong Huang
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  7. Lianmeng Zhang
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Correspondence to Dongyun Guo.

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Guo, D., Mao, W., Qin, Y. et al. Damping properties of epoxy-based composite embedded with sol–gel-derived Pb(Zr0.53Ti0.47)O3 thin film annealed at different temperatures. J Mater Sci: Mater Electron 23, 940–944 (2012). https://doi.org/10.1007/s10854-011-0524-5

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  • DOI: https://doi.org/10.1007/s10854-011-0524-5

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