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Using Stochastic Differential Equation for Verification of Noise in Analog/RF Circuits

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Abstract

Today’s analog/RF design and verification face significant challenges due to circuit complexity, process variations and short market windows. In particular, the influence of technology parameters on circuits, and the issues related to noise modeling and verification still remain a priority for many applications. Noise could be due to unwanted interaction between the circuit elements or it could be inherited from the circuit elements. In addition, manufacturing disparity influence the characteristic behavior of the manufactured circuits. In this paper, we propose a methodology for modeling and verification of analog/RF designs in the presence of noise and process variations. Our approach is based on modeling the designs using stochastic differential equations (SDE) that will allow us to incorporate the statistical nature of noise. We also integrate the device variation due to 0.18μ m fabrication process in an SDE based simulation framework for monitoring properties of interest in order to quickly detect errors. Our approach is illustrated on nonlinear Tunnel-Diode and a Colpitts oscillator circuits.

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Authors and Affiliations

  1. Department of Electrical and Computer Engineering, Concordia University, Montreal, Quebec, Canada

    Rajeev Narayanan & Sofiène Tahar

  2. Department of Computer Science, University of British Columbia, Vancouver, British Columbia, Canada

    Mohamed H. Zaki

Authors
  1. Rajeev Narayanan
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  2. Mohamed H. Zaki
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  3. Sofiène Tahar
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Correspondence to Rajeev Narayanan.

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Responsible Editor: K. Arabi

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Narayanan, R., Zaki, M.H. & Tahar, S. Using Stochastic Differential Equation for Verification of Noise in Analog/RF Circuits. J Electron Test 26, 97–109 (2010). https://doi.org/10.1007/s10836-009-5137-z

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  • DOI: https://doi.org/10.1007/s10836-009-5137-z

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