Abstract
The estimation of 1 dB compression and third-order intercept points can be obtained after the cross-correlation between dynamic current and output voltage of radio frequency power amplifiers. This estimation is performed using actual power measurements and not power inferred from voltage values. The underlining theory and a correlator that allows implementing this measurement on-chip are presented. The trade-off between measuring voltage and the actual power is also discussed and it is shown that different information concerning the output load is obtained when observing the PA’s output voltage and power. Simulation results, obtained with the model of a prototype demonstration chip, show that good accuracy can be obtained with relatively simple measurement conditions. These results include the analysis of optimum stimuli amplitudes and the effect of noise in estimation accuracy.
Similar content being viewed by others
References
Choongeol C, Eisenstadt WR, Stengel B, Ferrer E (2005) IIP3 Estimation from the gain compression curve. IEEE Transactions On Microwave Theory and Techniques. 53(4)
Cowles JC (2004) The evolution of integrated RF power measurement and control. IEEE MELECON 2004. Dubrovnik, Croatia
Ellinger F (2007) Radio frequency integrated circuits and technologies. Springer-Verlag, Berlin
Ellouz S, Gamand P, Kelma C, Vandewiele B, Allard B (2006) Combining internal probing with artificial neural networks for optimal RFIC testing. IEEE international test conference. pp. 1–9
Fan X, Onabajo M, Fernandez-Rodriguez FO, Silva-Martinez J, Sanchez-Sinêncio E (2008) A current injection built-in test technique for RF low-noise amplifiers. IEEE Transactions on Circuits and Systems I 55(7):1794–1804
Ferrario J, Wolf R, Moss S, Slamani M (2003) A low-cost test solution for wireless phone RFICs. IEEE communications magazine
Guillot F, Garcia P, Mouis M, Belot D (2006) Analysis of the intermodulation distortion and nonlinearity of common-base SiGeC HBTs. 13th IEEE International conference electronics, circuits and systems, ICECS '06. pp 664–667
Hafed M, Abaskharoun N, G. Roberts (2000) A stand-alone integrated test core for time and frequency domain measurements. Proceedings of the International Test Conference
Hassun R, Kuhm N, Posner R, Sweeney R, Vassilakis B (2001) Ultra-linear power amplifier characterization using dynamic range extension techniques. IEEE Symposium MTT
Maas SA, Microwave N, Circuits RF (2003) Nonlinear microwave and RF circuits. Artech House, Norwood
Mota P, da Silva JM, Long J (2007) Estimation and adaptive correction of PA's nonlinearities. 13th International mixed signals testing workshop and 3rd GHz/Gbps test workshop
Ryu J-Y, Kim BC, Sylla I (2006) A new low-cost RF built-in self-test measurement for system-on-chip transceivers. IEEE Transactions on Instrumentation and Measurement 55(2):381–388
Sokal NO, Sokal AD (1997) Accurate measurement of RF power amplifier efficiency and power output without and RF power meter. IEEE Journal of Solid-State Circuits. Vol. SC-12, No. 5
Strid, EW (2001) High-throughput RFIC wafer testing. ARFTG conference digest-spring, 57th Vol. 39:pp 1–5
Valdes-Garcia A, Silva-Martinez J, Sanchez-Sinêncio E (2006) On-chip testing techniques for RF wireless transceivers. IEEE Design & Test of Computers 23(4):268–277
Voorakaranam R, Akbay SS, Bhattacharya S, Cherubal S, Chatterjee A (2007) Signature testing of analog and RF circuits: algorithms and methodology. IEEE Transactions on Circuits and Systems I 54(5):1018–1031
Author information
Authors and Affiliations
Corresponding author
Additional information
Responsible Editor: K. Arabi
Rights and permissions
About this article
Cite this article
Mota, P.F., Machado da Silva, J.A. & Veiga, R.A. Estimation of RF PA Nonlinearities after Cross-correlating Current and Output Voltage. J Electron Test 26, 25–35 (2010). https://doi.org/10.1007/s10836-009-5128-0
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10836-009-5128-0