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Domain wall contributions to the properties of piezoelectric thin films

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Abstract

In bulk ferroelectric ceramics, extrinsic contributions associated with motion of domain walls and phase boundaries are a significant component of the measured dielectric and piezoelectric response. In thin films, the small grain sizes, substantial residual stresses, and the high concentration of point and line defects change the relative mobility of these boundaries. One of the consequences of this is that thin films typically act as hard piezoelectrics. This paper reviews the literature in this field, emphasizing the difference between the nonlinearities observed in the dielectric and piezoelectric properties of films. The effect of ac field excitation levels, dc bias fields, temperature, and applied mechanical stress are discussed.

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Acknowledgements

This work was supported by the Office of Naval Research (grant N00014-96-C-0387), the National Science Foundation (through grants DMR-0213623, DMR-0313764, and DMR-0602770), and the Center for Dielectric Studies at the Pennsylvania State University (STM); and the Swiss National Science Foundation (DD). The authors also gratefully acknowledge that some substrates were provided by Dr. P. Muralt (EPFL).

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  1. David V. Taylor

    Present address: Nanosys Inc., Palo Alto, CA, 94304, USA

Authors and Affiliations

  1. Materials Research Institute, The Pennsylvania State University, University Park, PA, 16802, USA

    Nazanin Bassiri-Gharb, Ichiro Fujii, Eunki Hong & Susan Trolier-McKinstry

  2. Materials Science and Engineering Department, The Pennsylvania State University, University Park, PA, 16802, USA

    Nazanin Bassiri-Gharb, Ichiro Fujii, Eunki Hong & Susan Trolier-McKinstry

  3. Ceramics Laboratory, Swiss Federal Institute of Technology (EPFL), Lausanne, Switzerland

    David V. Taylor & Dragan Damjanovic

  4. Materials and Device R&D, QUALCOMM MEMS Technologies, Incorporated, 2581 Junction Ave., 120.I., San Jose, CA, 95134, USA

    Nazanin Bassiri-Gharb

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  1. Nazanin Bassiri-Gharb
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Correspondence to Nazanin Bassiri-Gharb.

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Bassiri-Gharb, N., Fujii, I., Hong, E. et al. Domain wall contributions to the properties of piezoelectric thin films. J Electroceram 19, 49–67 (2007). https://doi.org/10.1007/s10832-007-9001-1

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