Abstract
A new device sizing method for CMOS analog integrated circuit is proposed. This method employs graphical sensitivity curves of certain performance metric with respect to device sizes, called size sensitivity, to guide the designer to choose proper device sizes semi-automatically. It is shown that the plot of sensitivity curves in the frequency-domain can exhibit quantitative performance dependence to device sizes nearby dominant pole/zero locations. For accurate sensitivity calculation, the dependence on dc sensitivity in the computation of ac sensitivity to device size is emphasized and an EKV model-based implementation is outlined. The proposed graphical semi-automatic analog sizing methodology differentiates itself from the traditional black-box approaches with which the user has no interference in the optimization process. An interactive semi-automatic analog sizing tool with a graphical interface allows the user to decide which device sizes are more rewarding to tune. An operational amplifier is sized by using the proposed interactive tool.
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This research was supported in part by the National Natural Science Foundation of China (NSFC Grant No. 61176129) and by a research Grant from Synopsys, Inc. (2010–2013).
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Shi, G., Chen, J., Tai, A. et al. A size sensitivity method for interactive CMOS circuit sizing. Analog Integr Circ Sig Process 77, 95–104 (2013). https://doi.org/10.1007/s10470-013-0143-6
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DOI: https://doi.org/10.1007/s10470-013-0143-6