Skip to main content
Log in

Exact inference for a simple step-stress model from the exponential distribution under time constraint

  • Published:
Annals of the Institute of Statistical Mathematics Aims and scope Submit manuscript

Abstract

In reliability and life-testing experiments, the researcher is often interested in the effects of extreme or varying stress factors such as temperature, voltage and load on the lifetimes of experimental units. Step-stress test, which is a special class of accelerated life-tests, allows the experimenter to increase the stress levels at fixed times during the experiment in order to obtain information on the parameters of the life distributions more quickly than under normal operating conditions. In this paper, we consider the simple step-stress model from the exponential distribution when there is time constraint on the duration of the experiment. We derive the maximum likelihood estimators (MLEs) of the parameters assuming a cumulative exposure model with lifetimes being exponentially distributed. The exact distributions of the MLEs of parameters are obtained through the use of conditional moment generating functions. We also derive confidence intervals for the parameters using these exact distributions, asymptotic distributions of the MLEs and the parametric bootstrap methods, and assess their performance through a Monte Carlo simulation study. Finally, we present two examples to illustrate all the methods of inference discussed here.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  • Arnold B.C., Balakrishnan N., Nagaraja H.N. (1992). A first course in order statistics. New York, Wiley

    MATH  Google Scholar 

  • Bagdonavicius V. (1978). Testing the hypothesis of additive accumulation of damages. Probability Theory and its Application 23: 403–408

    Google Scholar 

  • Bagdonavicius V., Nikulin M. (2002). Accelerated life models: modeling and statistical analysis. Boca Raton, Fl, Chapman and Hall/CRC Press

    MATH  Google Scholar 

  • Balakrishnan N., Kundu D., Ng H.K.T., Kannan N. (2007). Point and interval estimation for a simple step-stress model with Type-II censoring. Journal of Quality Technology 39: 35–47

    Google Scholar 

  • Bai D.S., Kim M.S., Lee S.H. (1989). Optimum simple step-stress accelerated life test with censoring. IEEE Transactions on Reliability 38: 528–532

    Article  MATH  Google Scholar 

  • Bhattacharyya G.K., Zanzawi S. (1989). A tampered failure rate model for step-stress accelerated life test. Communications in Statistics-Theory and Methods 18: 1627–1643

    Article  MathSciNet  Google Scholar 

  • Chen S.M., Bhattacharyya G.K. (1988). Exact confidence bound for an exponential parameter under hybrid censoring. Communications in Statistics-Theory and Methods 17: 1858–1870

    MathSciNet  Google Scholar 

  • Childs A., Chandrasekar B., Balakrishnan N., Kundu D. (2003). Exact likelihood inference based on Type-I and Type-II hybrid censored samples from the exponential distribution. Annals of the Institute of Statistical Mathematics 55: 319–330

    MATH  MathSciNet  Google Scholar 

  • David H.A., Nagaraja H.N. (2003). Order statistics, 3rd edn. Hobken, NJ, Wiley

    MATH  Google Scholar 

  • DeGroot M.H., Goel P.K. (1979). Bayesian estimation and optimal design in partially accelerated life testing. Naval Research Logistics Quarterly 26: 223–235

    Article  MATH  MathSciNet  Google Scholar 

  • Efron B., Tibshirani R. (1998). An introduction to the bootstrap. Boca Raton: Chapman and Hall/CRC Press

    Google Scholar 

  • Gouno E., Balakrishnan N. (2001). Step-stress accelerated life test. In Balakrishnan N., Rao C.R. (eds). Handbook of statistics-20: advances in reliability. Amsterdam, North-Holland, pp. 623–639

    Google Scholar 

  • Gouno E., Sen A., Balakrishnan N. (2004) Optimal step-stress test under progressive Type-I censoring. IEEE Transactions on Reliability 53: 383–393

    Article  Google Scholar 

  • Gupta R.D., Kundu D. (1998). Hybrid censoring schemes with exponential failure distributions. Communications in Statistics-Theory and Methods 27: 3065–3083

    Article  MATH  Google Scholar 

  • Johnson N.L., Kotz S., Balakrishnan N. (2004). Continuous univariate distributions, vol. 1. 2nd edn. New York, Wiley

    Google Scholar 

  • Khamis I.H., Higgins J.J. (1998). A new model for step-stress testing. IEEE Transactions on Reliability 47: 131–134

    Article  Google Scholar 

  • Kundu D., Basu S. (2000). Analysis of incomplete data in presence of competing risks. Journal of Statistical Planning and Inference 87: 221–239

    Article  MATH  MathSciNet  Google Scholar 

  • Madi M.T. (1993). Multiple step-stress accelerated life test: the tampered failure rate model. Communications in Statistics-Theory and Methods 22: 2631–2639

    Article  MATH  MathSciNet  Google Scholar 

  • Meeker W.Q., Escobar L.A. (1998). Statistical methods for reliability data. New York, Wiley

    MATH  Google Scholar 

  • Miller R., Nelson W.B. (1983). Optimum simple step-stress plans for accelerated life testing. IEEE Transactions on Reliability 32: 59–65

    MATH  Google Scholar 

  • Nelson W. (1980). Accelerated life testing: step-stress models and data analyis. IEEE Transactions on Reliability 29: 103–108

    Article  MATH  Google Scholar 

  • Nelson W. (1990). Accelerated testing: statistical models, test plans, and data analyses. New York, Wiley

    Google Scholar 

  • Sedyakin N.M. (1966). On one physical priciple in reliability theory (in Russian). Techn. Cybernetics 3: 80–87

    Google Scholar 

  • Watkins A.J. (2001). Commentary: inference in simple step-stress models. IEEE Transactions on Reliability 50: 36–37

    Article  Google Scholar 

  • Xiong C. (1998). Inference on a simple step-stress model with Type-II censored exponential data. IEEE Transactions on Reliability 47: 142–146

    Article  Google Scholar 

  • Xiong C., Milliken G.A. (1999). Step-stress life-testing with random stress change times for exponential data. IEEE Transactions on Reliability 48: 141–148

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to N. Balakrishnan.

About this article

Cite this article

Balakrishnan, N., Xie, Q. & Kundu, D. Exact inference for a simple step-stress model from the exponential distribution under time constraint. Ann Inst Stat Math 61, 251–274 (2009). https://doi.org/10.1007/s10463-007-0135-3

Download citation

  • Received:

  • Revised:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10463-007-0135-3

Keywords

Navigation