Abstract.
Infrared absorption measurements using a multiple internal reflection geometry are reported for condensed methanol at 90 K on Ag island films deposited on the oxidized and hydrogen-terminated surfaces of Si(111). The attenuated total reflection (ATR) spectra obtained as a function of methanol exposure (up to 14 L) show that a 1-nm mass thickness of Ag island film on the oxidized Si(111) surface yields an absorption intensity 2–3 times larger than the intensity in the absence of Ag on the oxidized surface. Deposition of the same thickness of Ag on the hydrogen-terminated Si(111) surface results in approximately twice the enhancement. The different magnitudes of the enhancement are discussed based on SEM micrographs for Ag island films formed on the oxidized and H-terminated Si(111) surfaces.
Similar content being viewed by others
Author information
Authors and Affiliations
Additional information
Received: 1 March 1999 / Accepted: 8 March 1999 / Published online: 5 May 1999
Rights and permissions
About this article
Cite this article
Wadayama, T., Suzuki, O., Takeuchi, K. et al. IR absorption enhancement for physisorbed methanol on Ag island films deposited on the oxidized and H-terminated Si(111) surfaces: effect of the metal surface morphology . Appl Phys A 69, 77–80 (1999). https://doi.org/10.1007/s003390050974
Issue Date:
DOI: https://doi.org/10.1007/s003390050974