Abstract
The performance of N-face AlGaN-based deep ultraviolet light-emitting diodes (UV LEDs) with superlattice electron blocking layer (EBL) is investigated by using two-dimensional numerical simulation. The simulated results demonstrate that the adoption of N-face UV LED with superlattice EBL is critical to improve the device’s performance. In comparison with the Ga-face UV LEDs with superlattice and conventional EBL, the N-face device structure with superlattice EBL possesses numerous advantages. By detailedly analyzing the profiles of energy band diagrams, distribution of carrier concentration, and radiative recombination rate, the advantages of N-face UV LED with superlattice EBL are attributed to the higher barrier for electron leakage, and simultaneously reduced barrier for hole injection compared with conventional Ga-face UV LEDs.
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Acknowledgments
This work is supported by the Natural Science of Foundation of Jiangsu Province (Grant Nos. BK20150158, BM2014402), National Natural Science Foundation of Special Theoretical Physics (Grant No. 11547168), the Fundamental Research Funds for Central Universities (Grant Nos. JUSRP51517, JUSRP11408, JUSRP51323B, JUSRP211A19), the China Postdoctoral Science Foundation (Grant Nos. 2014M561623, 2014M551559), Anhui Provincial Natural Science Foundation (Grant No. 1508085MF135), Key Science and Technology Program of Anhui Province (Grant No. 1501021045).
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Xie, F., Wang, F.X. Improved performance of N-face AlGaN-based deep ultraviolet light-emitting diodes with superlattice electron blocking layer. Appl. Phys. A 122, 781 (2016). https://doi.org/10.1007/s00339-016-0310-6
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DOI: https://doi.org/10.1007/s00339-016-0310-6