Abstract
In this work, the electrical properties of carbon–nickel films annealed at different temperatures (573, 773, 1073 and 1273 K) in the temperature range 15–300 K were investigated. The films were grown by radio frequency magnetron co-sputtering on quartz substrates at room temperature. The multiphonon hopping conduction mechanism is found to dominate the electrical transport in the temperature range 150–300 K. It can be seen that the room-temperature hopping rate (ΓRT) at 773 K has maximum value of 56.8 × 105 s−1. Our results of conductivity measurements at high temperature are in good agreement with strong carrier–lattice coupling model; on the other hand, the conductivity in the range 15–50 K is well described in terms of variable-range hopping (VRH) conduction mechanism. The localized state density around Fermi level N(E F) and the average hopping energy W hop at low temperature for the films annealed at 773 K have maximum value of 2.23 × 1023 (cm−3 eV−1) and minimum value of 9.74 × 10−4 eV, respectively.
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S. Ţălu, M. Bramowicz, S. Kulesza, A. Shafiekhani, A. Ghaderi, F. Mashayekhi, S. Solaymani, Ind. Eng. Chem. Res. 54(33), 8212–8218 (2015)
S. Stach, Ż. Garczyk, Ş. Ţălu, S. Solaymani, A. Ghaderi, R. Moradian, B. Nezafat Negin, S.M. Elahi, H. Gholamali, J. Phys. Chem. C 119(31), 17887–17898 (2015)
S. Ţălu, S. Stach, T. Ghodselahi, A. Ghaderi, S. Solaymani, A. Boochani, Ż. Garczyk J. Phys. Chem. B 119(17), 5662–5670 (2015)
S. Ţălu, S. Solaymani, R. Moradian, A. Ghaderi, M.R. Hantehzadeh, S.M. Elahi, Ż. Garczyk, S. Izadyar, J. Electroanal. Chem. 749, 31–41 (2015)
Ş. Ţălu, Micro and nanoscale characterization of three dimensional surfaces. Basics and applications (Napoca Star Publishing house, Cluj-Napoca, 2015)
R. Kumar, N. Khare, Thin Solid Films 516, 1302 (2008)
T. Ghodselahi, M.A. Vesaghi, A. Shafiekhani, M. Ahmadi, M. Panahandeh, M. Heidari Saani, Phys. B 405, 3949 (2010)
O. Garcia-Zarco, S.E. Rodil, M.A. Camacho-Lopez, Thin Solid Films 518, 1493 (2009)
V. Dalouji, S.M. Elahi, M. Saadi Alecasir, Phys. Scr. 90, 115802 (2015)
S.M. Elahi, V. Dalouji, D. Mehrparvar, S. Valedbagi, Mol. Cryst. Liq. Cryst. 587, 105 (2013)
V. Dalouji, S.M. Elahi, J. Korean Phys. Soc. 64, 857 (2014)
V. Dalouji, S.M. Elahi, J. Fusion Energy 34, 645 (2015)
V. Dalouji, S.M. Elahi, Surf. Rev. Lett. 23(3), 1650002 (2016)
N.F. Mott, E.A. Davis, Electronic processes in non-crystalline materials (Clarendon Press, Oxford, 1979)
T. Serin, A. Yildiz, S.H. Sahin, N. Serin, Phys. B 406, 3551 (2011)
J. Singh, K. Shimakawa, Advances in Amorphous Semiconductors (First published by Taylor & Francis 11 New Fetter Lone, London EC4P 4EE, 2003)
D. Emin, Phys. Rev. Lett. 32, 303 (1974)
N. Serin, A. Yildiz, E. Cama, S. Uzun, T. Serin, Super Lattice Microstruct 52(4), 759 (2012)
N. Robertson, L. Friedman, Philos. Mag. 33, 753 (1976)
A. Yildiz, D. Mardare, Philos. Mag. 91, 4401 (2011)
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Dalouji, V., Elahi, S., Solaymani, S. et al. Carbon films embedded by nickel nanoparticles: fluctuation in hopping rate and variable-range hopping with respect to annealing temperature. Appl. Phys. A 122, 541 (2016). https://doi.org/10.1007/s00339-016-0074-z
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DOI: https://doi.org/10.1007/s00339-016-0074-z