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Quantitative trait loci for resistance to stripe rust of wheat revealed using global field nurseries and opportunities for stacking resistance genes

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Abstract

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Quantitative trait loci controlling stripe rust resistance were identified in adapted Canadian spring wheat cultivars providing opportunity for breeders to stack loci using marker-assisted breeding.

Abstract

Stripe rust or yellow rust, caused by Puccinia striiformis Westend. f. sp. tritici Erikss., is a devastating disease of common wheat (Triticum aestivum L.) in many regions of the world. The objectives of this research were to identify and map quantitative trait loci (QTL) associated with stripe rust resistance in adapted Canadian spring wheat cultivars that are effective globally, and investigate opportunities for stacking resistance. Doubled haploid (DH) populations from the crosses Vesper/Lillian, Vesper/Stettler, Carberry/Vesper, Stettler/Red Fife and Carberry/AC Cadillac were phenotyped for stripe rust severity and infection response in field nurseries in Canada (Lethbridge and Swift Current), New Zealand (Lincoln), Mexico (Toluca) and Kenya (Njoro), and genotyped with SNP markers. Six QTL for stripe rust resistance in the population of Vesper/Lillian, five in Vesper/Stettler, seven in Stettler/Red Fife, four in Carberry/Vesper and nine in Carberry/AC Cadillac were identified. Lillian contributed stripe rust resistance QTL on chromosomes 4B, 5A, 6B and 7D, AC Cadillac on 2A, 2B, 3B and 5B, Carberry on 1A, 1B, 4A, 4B, 7A and 7D, Stettler on 1A, 2A, 3D, 4A, 5B and 6A, Red Fife on 2D, 3B and 4B, and Vesper on 1B, 2B and 7A. QTL on 1A, 1B, 2A, 2B, 3B, 4A, 4B, 5B, 7A and 7D were observed in multiple parents. The populations are compelling sources of recombination of many stripe rust resistance QTL for stacking disease resistance. Gene pyramiding should be possible with little chance of linkage drag of detrimental genes as the source parents were mostly adapted cultivars widely grown in Canada.

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Acknowledgements

Financial support was received from Agriculture and Agri-Food Canada (Grant number 2531), the Western Grains Research Foundation, and the Saskatchewan Agriculture Development Fund. Technical support from the SCRDC wheat breeding and molecular genetic technical staff, and Plant and Food Research, New Zealand and CIMMYT-Mexico and CIMMYT-Kenya technical staff is greatly appreciated. The authors acknowledge Heather L. Campbell, SCRDC/AAFC and Fran Clarke, AAFC (retired) for their contribution in data management and analysis.

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Authors and Affiliations

  1. Swift Current Research and Development Center, Agriculture and Agri-Food Canada, Swift Current, SK, S9H 3X2, Canada

    Firdissa E. Bokore, Richard D. Cuthbert, Ron E. Knox, Yuefeng Ruan, Samia Berraies & Brad Meyer

  2. Lethbridge Research and Development Center, Agriculture and Agri-Food Canada, 5403 1st Avenue South, Lethbridge, AB, T1J 4B1, Canada

    Harpinder S. Randhawa

  3. Morden Research and Development Centre, Agriculture and Agri-Food Canada, 101 Route 100, Morden, MB, R6M 1Y5, Canada

    Colin W. Hiebert & Curt McCartney

  4. Advancing Wheat Technologies, 870 Field Drive, Swift Current, SK, S9H 4N5, Canada

    Ron M. DePauw

  5. Department of Agronomy, Iowa State University, Ames, IA, USA

    Asheesh K. Singh & Arti Singh

  6. National Research Council of Canada, 110 Gymnasium Place, Saskatoon, SK, S7N 0W9, Canada

    Andrew G. Sharpe

  7. Department of Plant Sciences, University of Saskatchewan, Saskatoon, SK, S7N 5A8, Canada

    Amidou N’Diaye & Curtis J. Pozniak

  8. Plant and Food Research Canterbury Agriculture and Science Centre, Gerald St, Lincoln, 7608, New Zealand

    Catherine Munro & Andy Hay

  9. International Maize and Wheat Improvement Center (CIMMYT), Apdo., Postal 6-6-41, 06600, Mexico, DF, Mexico

    Karim Ammar

  10. Campo Experimental Valle de México INIFAP, Apdo., Postal 10, 56230, Chapingo, Edo. de México, Mexico

    Julio Huerta-Espino

  11. International Maize and Wheat Improvement Center (CIMMYT), Nairobi, Kenya

    Sridhar Bhavani

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  1. Firdissa E. Bokore
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  2. Richard D. Cuthbert
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Correspondence to Firdissa E. Bokore or Richard D. Cuthbert.

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Communicated by Xianchun Xia.

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Bokore, F.E., Cuthbert, R.D., Knox, R.E. et al. Quantitative trait loci for resistance to stripe rust of wheat revealed using global field nurseries and opportunities for stacking resistance genes. Theor Appl Genet 130, 2617–2635 (2017). https://doi.org/10.1007/s00122-017-2980-7

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