Skip to main content

Parallel simulation and test of VLSI array logic

  • VLSI Testing And Derivation
  • Conference paper
  • First Online:
VLSI Algorithms and Architectures (AWOC 1988)

Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 319))

Included in the following conference series:

  • 171 Accesses

Abstract

We consider the task of accelerating existing array logic CAD software by running them under parallel processing environments. We restrict our discussion to VLSI programmable logic arrays (PLAs); we present results based on fault simulation/test generation software implemented for PLAs. Due to the regular layout of such array logic, considerable parallelism is expected in any data processing problem involving these modules. However, depending on the underlying machine model, and the adopted programming model, varying levels of speed-up are exhibited. We first consider a typical pipelined, vector mainframe like the IBM 3090 VF. Through a combination of novel problem reformulation strategies, and educated coding guidelines for vector machines, we show how an original scalar program can be efficiently speeded up on such machines. The other machine model considered is that of a shared memory parallel processing system. Our results here are based on experiments run under an experimental multi-processor VM environment (VM/EPEX) which has been set up to predict the possible speed-up on a parallel processor such as RP3. The overall processing environment is assumed to be constrained to a scientific/engineering one, with Fortran as the primary coding medium and the hardware biased toward numerically-intensive applications.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. T. Blank, “A survey of hardware accelerators used in computer-aided design,” IEEE Design & Test of Computers, Vol. 1, No. 3, pp. 21–39, August 1984.

    Article  Google Scholar 

  2. H. Fleisher and L. I. Maissel, “An introduction to array logic,” IBM Journal of Research and Development, Vol. 19, pp. 98–109, March 1975.

    Article  Google Scholar 

  3. E. I. Muehldorf and T. W. Williams, “Optimized stuck fault test pattern generation for PLA macros,” Dig. Semiconductor Test Symp., Cherry Hill, NJ, October 25–27, 1977, pp. 88–101.

    Google Scholar 

  4. D. L. Ostapko and S. J. Hong, “Fault analysis and test generation for programmable logic arrays,” IEEE Trans. Comput., vol. C-28, Sept. 1979, pp. 617–626.

    MathSciNet  Google Scholar 

  5. J. Smith, “Detection of faults in programmable logic arrays,” IEEE Trans. Computers, vol. C-28, Nov. 1979, pp. 845–853.

    Google Scholar 

  6. P. Bose and J. A. Abraham, “Test generation for programmable logic arrays,” Proc. 19th Design Automation Conf., Las Vegas, June 1982, pp. 574–580.

    Google Scholar 

  7. P. Bose, “Logical fault analysis and design for testability of programmable logic arrays,” Proc. 23rd Annual Allerton, Conf., Monticello, October 1985, pp. 158–167.

    Google Scholar 

  8. P. Bose, “Functional testing of programmable logic arrays,” IBM Research Report RC 10681, Yorktown Heights, NY October 1984.

    Google Scholar 

  9. R-S. Wei and A. Sangiovanni-Vincentelli, “PLATYPUS: A PLA test pattern generation tool,” IEEE Trans. on Computer-Aided Design, Vol. CAD-5, No. 4, pp. 633–643, October 1986.

    Google Scholar 

  10. V. K. Agarwal, “Multiple fault detection in programmable logic arrays,” IEEE Trans. on Computers, vol. C-29, pp. 518–522, June 1980.

    Google Scholar 

  11. K. S. Ramanatha and N. N. Biswas, “A design for testability of undetectable crosspoint faults in programmable logic arrays,” IEEE Trans. Comput., vol. C-32, June 1983, pp. 551–557.

    Google Scholar 

  12. S. M. Reddy and D. S. Ha, “A new approach to the design of testable PLAs,” IEEE Trans. on Computers, Vol. C-36, No. 2, pp. 201–211, February 1987.

    Google Scholar 

  13. H. Fujiwara and K. Kinoshita, “A design of programmable logic arrays with universal test sets,” IEEE Trans. Comput., vol. C-30, pp. 823–828, November 1981.

    Google Scholar 

  14. J. P. Roth, W. G. Bouricius and P. R. Schneider, “Programmed algorithms to compute tests to detect and distinguish between failures in logic circuits,” IEEE Trans. Electron. Comput., vol. EC-16, pp. 567–579, October 1967.

    MathSciNet  Google Scholar 

  15. N. Ishiura, H. Yasuura and S. Yajima, “High-speed logic simulation on vector processors,” IEEE Trans. on Computer-Aided Design, Vol. CAD-6, No. 3, May 1987.

    Google Scholar 

  16. D. L. Ostapko, Z. Barzilai and G. M. Silberman, “Fast fault simulation in a parallel processing environment,” Proc. Int'l. Test Conf., Washington, D.C., September 1987.

    Google Scholar 

  17. F. Darema and G. F. Pfister, “Multipurpose parallelism for VLSI CAD on the RP3,” IEEE Design & Test of Computers, Vol. 4, No. 5, pp. 19–27, October 1987.

    Article  Google Scholar 

  18. F. Darema et al., “A Single-Program-Multiple-Data computational model for EPEX Fortran,” IBM Research Report RC 11552, Yorktown Heights, NY, October 1986.

    Google Scholar 

  19. D. J. Kuck, The Structure of Computers and Computations, Vol. I, John Wiley & Sons, New York, 1978.

    Google Scholar 

  20. B. Liu and N. Strother, “Peak vector performance from VS Fortran,” IBM Research Report RC 12849, June 1987.

    Google Scholar 

  21. P. Bose, “A brief status report on EAVE: an Expert Advisor for Vectorization,” IBM Research Report (to appear, December 1987).

    Google Scholar 

  22. K. Hwang, “Partitioned matrix algorithms for VLSI arithmetic systems,” IEEE Trans. on Computers, Vol. C-31, No. 12, pp. 1215–1224, December 1982.

    Google Scholar 

  23. R. M. Russell, “The CRAY-1 computer system,” Comm. ACM, vol. 21, no. 1, pp. 63–72, January 1978.

    Article  Google Scholar 

  24. Several papers on the IBM 3090 system, architecture and performance, IBM Systems Journal, Vol. 25, No. 1, pp. 4–82, 1986.

    Google Scholar 

  25. G. F. Pfister et al., “The RP3 Research Parallel Processor Prototype (RP3): introduction and architecture,” Proc. Int'l. Conf. on Parallel Processing, August 1985, pp. 764–771.

    Google Scholar 

  26. P. Bose, “Fast Fault Simulation and Test Generation for PLAs in a Parallel Processing Environment,” IBM Research Report RC 13343, Yorktown Heights, NY, December 1987.

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

John H. Reif

Rights and permissions

Reprints and permissions

Copyright information

© 1988 Springer-Verlag Berlin Heidelberg

About this paper

Cite this paper

Bose, P. (1988). Parallel simulation and test of VLSI array logic. In: Reif, J.H. (eds) VLSI Algorithms and Architectures. AWOC 1988. Lecture Notes in Computer Science, vol 319. Springer, New York, NY. https://doi.org/10.1007/BFb0040397

Download citation

  • DOI: https://doi.org/10.1007/BFb0040397

  • Published:

  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-0-387-96818-6

  • Online ISBN: 978-0-387-34770-7

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics