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In situ studies of ion irradiation effects in an electron microscope

  • Symposium on Irradiation-Enhanced Materials Science and Engineering
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Abstract

The High-Voltage Electron Microscope (HVEM)-Accelerator Facility at Argonne National Laboratory (ANL) has been used to gain insight into the process of collapse of displacement cascades to vacancy loops in metals (Ni, Cu, Fe, Ni-Si, and Ni-Al) and the crystalline-amorphous transition produced in GaAs by ion implantation.

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This paper is based on a presentation made in the symposium “Irradiation-Enhanced Materials Science and Engineering” presented as part of the ASM INTERNATIONAL 75th Anniversary celebration at the 1988 World Materials Congress in Chicago, IL, September 25-29, 1988, under the auspices of the Nuclear Materials Committee of TMS-AIME and ASM-MSD.

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Vetrano, J.S., Bench, M.W., Robertson, I.M. et al. In situ studies of ion irradiation effects in an electron microscope. Metall Trans A 20, 2673–2680 (1989). https://doi.org/10.1007/BF02670160

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