Abstract
There are lots of methods for measuring the nonlinear refraction and absorption coefficients of materials. The z-scan is one of the most simplest and sensitive methods and has been well developed since Sheik-Bahae et al. (IEEE J Quantum Electron 26:760–769, 1990; Opt Lett 14:955–958, 1989) gave the principle and experimental setup, such as time-resolved z-scan (Wang et al., J Opt Soc Am B 11:1009–1017, 1994), beam dimension measurement z-scan (Tsigaridas et al., Appl Phys B 76:83–86, 2003) two-beam multi-functional z-scan (Liu and Wei, China Invention Patent: ZL 20091 0054823.1, 2009; Ma and Wei, China Invention Patent: ZL 20101 0139025.1, 2010). In this chapter, the basic theory of z-scan method is introduced, and some issues for measurement of semi-transparent samples and thin films are pointed out. The improved z-scan schematics are presented, and the data processing methods are described accordingly.
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Wei, J. (2015). Characterization Methods for Nonlinear Absorption and Refraction Coefficients. In: Nonlinear Super-Resolution Nano-Optics and Applications. Springer Series in Optical Sciences, vol 191. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-44488-7_3
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DOI: https://doi.org/10.1007/978-3-662-44488-7_3
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