Abstract
The microstructural characterization of materials is a critical step to understand structure--property relationships in sintered materials. Altering the processing parameters during sintering can lead to variations of the materials microstructure and, hence, their macroscopic properties. This chapter reviews experimental techniques for the atomic resolution characterization of microstructural defects. Emphasis is given to a variety of electron microscopy techniques and how these can be used to gain a more fundamental understanding of sintering behavior, such as defect segregation and grain growth. The recent advent of novel in situ electron microscopy techniques has enabled the atomic-scale investigation of densification mechanisms and their kinetics that occur during sintering. A review of available techniques is presented and first experimental results are discussed.
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References
Williams, D.B., Carter, C.B.: Transmission Electron Microscopy A Textbook for Materials Science, 2nd edn. Springer, New York (2009)
Goldstein, J., Newbury, D.E., Joy, D.C., Lyman, C., Echlin, P.E., Lifshin, E., Sawyer, L., Michael, J.: Scanning Electron Microscopy and X-ray Microanalysis, 3rd edn. Kluwer Academic/Plenum Publishers, New York (2003)
Reimer, L.: Scanning Electron Microscopy, Springer-Verlag, Berlin, p. 457. (1985)
Topping, T., Ahn, B., Li, Y., Nutt, S., Lavernia, E.: Metall. Mater. Trans. A 43, 505–519 (2012)
Strecker, A., Bader, U., Kelsch, M., Salzberger, U., Sycha, M., Gao, M., Richter, G., van Benthem, K.: Zeitschrift fur Metallkunde 94(3), 290–297 (2003)
Anderson, R., Klepeis, S.J.: In A new tripod polisher method for preparing TEM specimens of particles and fibers, Mater. Res. Soc., Pittsburgh, PA, USA., 1997; Anderson, R. M.; Walck, S. D., Eds. Mater. Res. Soc., Pittsburgh, PA, USA., 1997; pp 193–199
Wei, L.-Y., Li, T.: Microsc. Res. Tech. 36, 380–381 (1997)
Getter, M.E., Ornstein, L.: Phys. Tech. Biol. Res. 3, 627 (1956)
Heidenreich, R.D.J.: Appl. Phys. 20, 993 (1949)
Giannuzzi, L.A., Stevie, F.A.: Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice. Springer Verlag, New York (2004)
Giannuzzi, L.A., Stevie, F.A.: Micron 30(3), 197–204 (1999)
Volkert, C.A., Minor, A.M.: MRS Bull. 32(5), 389–395 (2007)
Reimer, L.: Elektronenmikroskopische Untersuchungs-und Präparationsmethoden. Springer-Verlag, Berlin (1959)
Strecker, A., Mayer, J., Baretzky, B., Eigenthaler, U., Gemming, T., Schweinfest, R., Ruhle, M.: J. Electron Microsc. 48(3), 235–244 (1999)
Strecker, A., Salzberger, U., Mayer, J.: Prakt. Metallogr. 30, 482 (1993)
Reimer, L.: Transmission Electron Microscopy, 2nd edn. Springer, Berlin (1997)
Varela, M., Lupini, A.R., van Benthem, K., Borisevich, A.Y., Chisholm, M.F., Shibata, N., Abe, E., Pennycook, S.J.: Annu. Rev. Mater. Res. 35, 539–569 (2005)
Egerton, R.F.: Electron Energy Loss Spectroscopy in the Electron Microscope, 2nd edn. Plenum Press, New York (1996)
Potton, R.J.: Rep. Prog. Phys. 67(5), 717–754 (2004)
Scherzer, O.: Zeit. Phys. 101, 593--603 (1936)
Dellby, N., Krivanek, O.L., Nellist, P.D., Batson, P.E., Lupini, A.R.: J. Electron Microsc. 50, 177–185 (2001)
Krivanek, O.L., Dellby, N., Lupini, A.R.: Ultramicroscopy 78, 1–11 (1999)
Scherzer, O.: Optik 2(2), 114–132 (1947)
Rose, H.: Optik 85(1), 19–24 (1990)
Haider, M., Rose, H., Uhlemann, S., Schwan, E., Kabius, B., Urban, K.: Ultramicroscopy 75(1), 53–60 (1998)
O’Keefe, M.A., Allard, L.F., Blom, D.A.: J. Electron Microsc. 54(3), 169–180 (2005)
Kisielowski, C., Freitag, B., Bischoff, M., et al.: Microsc. Microanal. 14(5), 469–477 (2008)
Pennycook, S.J., Chisholm, M.F., Lupini, A.R., Varela, M., van Benthem, K., Borisevich, A.Y., Oxley, M.P., Luo, W., Pantelides, S.T.: Materials Applications of Aberration-Corrected Scanning Transmission Electron Microscopy. In Advances in Imaging and Electron Physics. Elsevier Academic Press Inc, San Diego 153, pp. 327–384 (2008)
Nellist, P.D., Chisholm, M.F., Dellby, N., et al.: Science 305(5691), 1741–1741 (2004)
Peng, Y.P., Oxley, M.P., Lupini, A.R., et al.: In Spatial resolution and information transfer in scanning transmission electron microscopy. Microscopy and Microanalysis 14, 36–47 (2008)
Krivanek, O.L., Chisholm, M.F., Nicolosi, V., et al.: Nature 464(7288), 571–574 (2010)
Oh, S.H., van Benthem, K., Molina, S.I., et al.: Nano Lett. 8(4), 1016–1019 (2008)
Shibata, N., Painter, G.S., Satet, R.L., et al.: Phys. Rev. B: Condens. Matter 72(14), 4 (2005)
Shibata, N., Pennycook, S.J., Gosnell, T.R., et al.: Nature 428(6984), 730--733 (2004)
van Benthem, K., Contescu, C.I., Pennycook, S.J., Gallego, N.C.: Single Pd Atoms in Activated Carbon Fibers for Hydrogen Storage. Carbon 49(12), 4059–4063 (2009)
Varela, M., Findlay, S.D., Lupini, A.R., et al. Phys. Rev. Lett. 92(9), 095502 (2004)
Wang, S.W., Borisevich, A.Y., Rashkeev, S.N., et al.: Nat. Mater. 3(4), 274–274 (2004)
Borisevich, A.Y., Lupini, A.R., Pennycook, S.J.: Proc. Natl. Acad. Sci. U S A 103(9), 3044–3048 (2006)
Borisevich, A.Y., Lupini, A.R., Travaglini, S., Pennycook, S.J.: J. Electron Microsc. 55(1), 7–12 (2006)
van Benthem, K., Lupini, A.R., Kim, M., Baik, H.S., Doh, S., Lee, J.H., Oxley, M.P., Findlay, S.D., Allen, L.J., Luck, J.T., Pennycook, S.J.: Appl. Phys. Lett. 87(3), 3 (2005)
van Benthem, K., Lupini, A.R., Oxley, M.P., Findlay, S.D., Allen, L.J., Pennycook, S.J.: Ultramicroscopy 106(11–12), 1062–1068 (2006)
Raj, R., Cologna, M., Francis, J.S.C.: J. Am. Ceram. Soc. 94(7), 1941–1965 (2011)
Cologna, M., Raj, R.: J. Am. Ceram. Soc. 94(2), 391–395 (2011)
Kodambaka, S., Hannon, J.B., Tromp, R.M., Ross, F.M.: Nano Lett. 6(6), 1292–1296 (2006)
Sharma, R.: J. Mater. Res. 20(7), 1695–1707 (2005)
Kamino, T., Yaguchi, T., Konno, M., et al.: J. Electron Microsc. 54(6), 497–503 (2005)
de Jonge, N., Peckys, D.B., Kremers, G.J., Piston, D.W.: Proc. Natl. Acad. Sci. U S A 106(7), 2159–2164 (2009)
Allard, L.F., Bigelow, W.C., Jose-Yacaman, M., et al.: Microsc. Res. Tech. 72(3), 208--215 (2009)
Allard, L.F., Bigelow, W.C., Nackashi, D.P., Damiano, J., Mick, S.E.: Microsc. Microanal. 14(2), 792--793 (2008)
Holland, T.B., Thron, A.M., Bonifacio, C.S., Mukherjee, A.K., van Benthem, K.: Appl. Phys. Lett. 96(24), 243106 (2010)
Minor, A.M., Morris, J.W., Stach, E.A.: Appl. Phys. Lett. 79(11), 1625–1627 (2001)
Stach, E.A., Freeman, T., Minor, A.M., et al.: Microsc. Microanal. 7(6), 507–517 (2001)
Kim, J.S., LaGrange, T., Reed, B.W., et al.: Science 321(5895), 1472–1475 (2008)
LaGrange, T., Campbell, G.H., Reed, B., et al.: Ultramicroscopy 108(11), 1441–1449 (2008)
Reed, B.W., Armstrong, M.R., Browning, N.D., Campbell, G.H., Evans, J.E., LaGrange, T., Masiel, D.J.: Microsc. Microanal. 15(4), 272–281 (2009)
Lobastov, V.A., Srinivasan, R., Zewail, A.H.: Proc. Natl. Acad. Sci. U S A 102(20), 7069–7073 (2005)
Park, H.S., Baskin, J.S., Kwon, O.-H., Zewail, A.H.: Nano Lett. 7(9), 2545–2551 (2007)
Kim, S., Jain, P., Avila-Paredes, H.J., Thron, A., van Benthem, K., Sen, S.: J. Mater. Chem. 20(19), 3855–3858 (2010)
Midgley, P.A., Weyland, M.: Ultramicroscopy 96(3–4), 413–431 (2003)
Lange, F.F.: J. Am. Ceram. Soc. 56(10), 518–522 (1973)
Sun, E.Y., Becher, P.F., Hsueh, C.H., et al.: Acta Mater. 47(9), 2777--2785 (1999)
Kramer, M., Hoffmann, M.J., Petzow, G.: J. Am. Ceram. Soc. 76(11), 2778--2784 (1993)
Painter, G.S., Averill, F.W., Becher, P.F., Shibata, N., van Benthem, K., Pennycook, S.J.: Phys. Rev. B: Condens. Matter 78(21), 9 (2008)
Winkelman, G.B., Dwyer, C., Hudson, T.S., et al.: Philos. Mag. Lett. 84(12), 755--762 (2004)
van Benthem, K., Painter, G.S., Averill, F.W., et al.: Appl. Phys. Lett. 92(16), 163110 (2008)
Asoro, M.A., Kovar, D., Shao-Horn, Y., et al.: Nanotechnology 21(2), 025701 (2010)
Jones, R.D., Rowlands, D., Rossiter, P.L.: Scripta Metall. 5(10), 915--919 (1971)
Marcos, M.L., González Velasco, J.: Chem. Phys. Lett. 283(5--6), 391--394 (1998)
Matsuno, M., Bonifacio, C.S., Holland, T.B., Van Benthem, K.: (in preparation) (2011)
Waser, R.: Nanoelectronics and Information Technology: Advanced Electronic Materials and Novel Devices, 2nd edn., p. 1002. Wiley, New York (2005)
Bonifacio, C.S., Thron, A.M., Bersuker, G., van Benthem, K.: Microsc. Microanal. 16(S2), 1298--1299 (2010)
Bersuker, G., Heh, D., Park, H., Khanal, P., Larcher, L., Padovani, A., Lenahan, P.M., Ryan, J.T., Lee, B.H., Tseng, H., Jammy, R.: In Breakdown in the metal/high-k gate stack: Identifying the “weak link” in the multilayer dielectric. In: International Electron Devices Meeting (IEDM) Technical Digest, 2008, pp. 791--794 (2008)
Bonifacio, C.S., van Benthem, K.: J. Appl. Phys. (2012) submitted
Munir, Z.A.: J. Mater. Sci. 14(11), 2733--2740 (1979)
Acknowledgments
Discussions with Drs. T.B. Holland, A.K. Mukherjee, Z.A. Munir, J. Groza (UC Davis) and S. Schwartz and O. Guillon (TU Darmstadt) are gratefully acknowledged. Help provided by Dr. T. LaGrange (LLNL) for the acquisition of orientation images by TEM was invaluable. The author recognizes his graduate and undergraduate students for their diligent work on the presented projects, specifically Ms. C.S. Bonifacio, Mr. H. Ghadialy, Ms. M. Matsuno, Mr. J. Rufner, and Mr. A. Thron. This work was funded partially by UC Davis start-up funds and a CAREER award from the US National Science Foundation (DMR-0955638).
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van Benthem, K. (2012). Characterization of Microstructures Before, During and After Densification. In: Castro, R., van Benthem, K. (eds) Sintering. Engineering Materials, vol 35. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-31009-6_10
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DOI: https://doi.org/10.1007/978-3-642-31009-6_10
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