Skip to main content

Research on an Educational Software Defect Prediction Model Based on SVM

  • Conference paper
Book cover Entertainment for Education. Digital Techniques and Systems (Edutainment 2010)

Part of the book series: Lecture Notes in Computer Science ((LNISA,volume 6249))

Abstract

We must pay attention and find defects, defects through the prediction to quantify the quality management and quality in order to achieve this goal, requires an estimate of the various defect detection process. Software defects are the departure of software are products’ anticipative function. This paper collecting the data of the software defects, then, using the SVM model the predictive values are gained analyzing the predictive results, software are organizations can improve software control measure software process and allocate testing resources effectively.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 84.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. Jalote, P.: CMM in Practice-Processes for Executing Software Projects at Infosys, pp. 94–95, 172–175. Electronic Industry Press, Beijing (2002)

    Google Scholar 

  2. Zhi, S.: Knowledge Discovery, pp. 7–8, 213–215. Tsinghua University Press, Beijing (2002)

    Google Scholar 

  3. Yang, J.-E., Wei, C.: China. Based on support vector machine safety input demand forecasting research. Coal Economic Research 9, 84–85 (2009)

    Google Scholar 

  4. Lin, Z.X., Wei, L., Bo, X.C.: The new discrete time-varying delay system stability condition. Journal of Northeast Normal University 3, 31–36 (2008)

    Google Scholar 

  5. Bennett, K.P., Campbell, C.: Support Vector Machines: Hype or Hallelujah? SIGKDD Explorations 2(2), 1–6 (2000)

    Article  Google Scholar 

  6. Barabino, N., Pallavicini, M., Petrolini, A.: Support vector machines vs multi-layer perceptrons in particle identification. In: Proceedings of the European Sympostium on Artifical Neural Networks’99, pp. 257–262. D-Facto Press, Belgium (1999)

    Google Scholar 

  7. International Standards Organization, Information Technology-Software Product Evaluation-Quality Characteristics and Guidelines for Their Use. ISO/IEC IS9126,Geneva (1991)

    Google Scholar 

  8. Kan, S.H.: Metrics and Models in Software Quality Engineering. Addison-Wesley, Reading (1995)

    MATH  Google Scholar 

  9. Musa, J.D., Iannino, A., Okumoto, K.: Software Reliability-Measurement, Predication, Application. McGraw Hill, New York (1987)

    Google Scholar 

  10. Grady, R., Caswell, D.: Software Metrics: Establishing a Company-wide Program. Prentice Hall, Englewood Cliffs (1987)

    Google Scholar 

  11. Grady, R.: Practical Software Metrics for Project Management and Process Improvement. Prentice Hall PTR, Englewood Cliffs (1992)

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2010 Springer-Verlag Berlin Heidelberg

About this paper

Cite this paper

Liu, Gj., Wang, Wy. (2010). Research on an Educational Software Defect Prediction Model Based on SVM. In: Zhang, X., Zhong, S., Pan, Z., Wong, K., Yun, R. (eds) Entertainment for Education. Digital Techniques and Systems. Edutainment 2010. Lecture Notes in Computer Science, vol 6249. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-14533-9_22

Download citation

  • DOI: https://doi.org/10.1007/978-3-642-14533-9_22

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-14532-2

  • Online ISBN: 978-3-642-14533-9

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics