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Fourier-Based Inspection of Free-Form Reflective Surfaces

  • Conference paper
Book cover Advanced Concepts for Intelligent Vision Systems (ACIVS 2008)

Part of the book series: Lecture Notes in Computer Science ((LNIP,volume 5259))

Abstract

A general free-form surface inspection approach relying on the projection of a structured light pattern and the interpretation of the generated stripe structures by means of Fourier-based features is proposed in this paper.

The major concerns of this paper are the determination of various refrence sets of stripe patterns, and the detailed investigation on the subset of Fourier features that best characterizes free-form bright/dark structures. In order to tackle the inspection problem with a general approach, a first part of this paper is dedicated to the definition of different image data sets that correspond to various types of free-form specular shapes recorded with a structured illumination. A second part deals with the optimization of the most appropriate pattern recognition process. The optimization is dedicated to the use of different pattern arrangements, and the evaluation of different Fourier feature subsets.

It is shown that with only 10 Fourier features and a certain pattern arrangement, high classification rates of free-form surfaces can be obtained.

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Author information

Authors and Affiliations

  1. Fraunhofer Institut für Integrierte Schaltungen IIS, Am Wolfsmantel 33, D-91058, Erlangen, Germany

    Y. Caulier

  2. GSM, Institut Fresnel, CNRS-UMR, École Centrale Marseille, 6133, Université Aix-Marseille III, Marseille Cedex 20, France

    S. Bourennane

Authors
  1. Y. Caulier
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  2. S. Bourennane
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Editor information

Editors and Affiliations

  1. DGA/D4S/MRIS, 94114, Arcueil, France

    Jacques Blanc-Talon

  2. Ecole Centrale de Marseille, 13451, Marseille, France

    Salah Bourennane

  3. Ghent University, 9000, Gent, Belgium

    Wilfried Philips

  4. CSIRO ICT Centre, NSW 1710, Sydney, Australia

    Dan Popescu

  5. University of Antwerp, 2610, Wilrijk, Belgium

    Paul Scheunders

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© 2008 Springer-Verlag Berlin Heidelberg

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Caulier, Y., Bourennane, S. (2008). Fourier-Based Inspection of Free-Form Reflective Surfaces. In: Blanc-Talon, J., Bourennane, S., Philips, W., Popescu, D., Scheunders, P. (eds) Advanced Concepts for Intelligent Vision Systems. ACIVS 2008. Lecture Notes in Computer Science, vol 5259. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-88458-3_12

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  • DOI: https://doi.org/10.1007/978-3-540-88458-3_12

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-88457-6

  • Online ISBN: 978-3-540-88458-3

  • eBook Packages: Computer ScienceComputer Science (R0)

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