Overview
- Concise, thorough review of the most important breakthroughs of the past two decades
- Up-to-date references
- Written by leading experts
- Includes supplementary material: sn.pub/extras
Part of the book series: Topics in Applied Physics (TAP, volume 105)
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About this book
During the past two decades, revolutionary breakthroughs have occurred in the understanding of ferroelectric materials, both from the perspective of theory and experiment. First principles approaches, including the Berry phase formulation of ferroelectricity, now allow accurate, quantitative predictions of material properties, and single crystalline thin films are now available for fundamental studies of these materials. In addition, the need for high dielectric constant insulators and nonvolatile memories in semiconductor applications has motivated a renaissance in the investigation of these materials. This book addresses the paradigmatic shifts in understanding brought about by these breakthroughs, including the consideration of novel fabrication methods and nanoscale applications of these materials, and new theoretical methods such as the effective Hamiltonian approach and density functional theory.
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Table of contents (10 chapters)
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Front Matter
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Back Matter
Editors and Affiliations
Bibliographic Information
Book Title: Physics of Ferroelectrics
Book Subtitle: A Modern Perspective
Editors: Karin M. Rabe, Charles H. Ahn, Jean-Marc Triscone
Series Title: Topics in Applied Physics
DOI: https://doi.org/10.1007/978-3-540-34591-6
Publisher: Springer Berlin, Heidelberg
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2007
Hardcover ISBN: 978-3-540-34590-9Published: 30 July 2007
Softcover ISBN: 978-3-642-07096-9Published: 30 November 2010
eBook ISBN: 978-3-540-34591-6Published: 20 July 2007
Series ISSN: 0303-4216
Series E-ISSN: 1437-0859
Edition Number: 1
Number of Pages: XII, 388
Number of Illustrations: 87 b/w illustrations, 36 illustrations in colour
Topics: Metallic Materials, Electronics and Microelectronics, Instrumentation, Surfaces and Interfaces, Thin Films, Nanotechnology