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Reliability Challenges of Silicon-Based Physically Unclonable Functions

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Physically Unclonable Functions

Abstract

This chapter aims to:

  1. 1.

    Explain the physical origins of the major reliability issues affecting CMOS technology.

  2. 2.

    Discuss how these issues can affect the usability of PUF technology.

  3. 3.

    Present a case study on the evaluation of the impact of CMOS aging on the quality metrics of PUF designs.

It is hoped that this chapter will give the reader an in-depth understanding of the reliability challenges in nano-scale CMOS technologies and their effects on the usability of silicon-based PUF designs.

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Authors and Affiliations

  1. Southampton, UK

    Basel Halak

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  1. Basel Halak
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Correspondence to Basel Halak .

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Halak, B. (2018). Reliability Challenges of Silicon-Based Physically Unclonable Functions. In: Physically Unclonable Functions . Springer, Cham. https://doi.org/10.1007/978-3-319-76804-5_3

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  • DOI: https://doi.org/10.1007/978-3-319-76804-5_3

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-76803-8

  • Online ISBN: 978-3-319-76804-5

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