Abstract
Since the first demonstration of thin-film piezoelectric resonators [1], high performance MEMS devices including low insertion-loss resonators and filters [2, 3], small form factor energy harvesters [4], large-force actuators [5], and highly sensitive resonant sensors [6–8] have been successfully demonstrated using piezoelectric materials such as AlN, ZnO, and PZT. Thin film AlN has been of great interest mainly due to the high quality of its film growth and CMOS compatibility, as well as well-developed process recipes. The processing advantages in addition to the superior piezoelectric and acoustic properties of AlN, including large wave propagation velocity [9] and low thermoacoustic dissipation [10], have made it a popular choice for piezoelectric transduction of MEMS resonant devices.
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Tabrizian, R. (2017). Fabrication Process Flows for Implementation of Piezoelectric MEMS Resonators. In: Bhugra, H., Piazza, G. (eds) Piezoelectric MEMS Resonators. Microsystems and Nanosystems. Springer, Cham. https://doi.org/10.1007/978-3-319-28688-4_12
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DOI: https://doi.org/10.1007/978-3-319-28688-4_12
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