Abstract
Bulk crystal growth of aluminum nitride (AlN) comes into focus in order to provide substrates for deep-UV optoelectronics (LEDs, lasers, and sensors) which are typically based on Al-rich AlGaN epitaxial layers and structures. On AlN substrates, pseudomorphic AlGaN layers can be deposited with compressive strain and high structural quality [1–3]. In this context, the growth of AlN crystals by sublimation and recondensation (physical vapor transport method) at temperatures exceeding 2000 °C has proven to be the method of choice, as the boules and substrates show very high structural perfection at reasonable growth rates. Availability of AlN substrates as well as their useable area, structural quality, and electrical/optical properties are directly related to growth technology issues, including selection of set-up materials, seeding strategy, and pre-purification efforts. After a brief overview of history and applications of bulk AlN, the basic principles of AlN bulk growth by physical vapor transport (PVT) are reviewed. The formation of extended defects and the incorporation of impurities during growth as well as their impact on the material’s optical and electrical properties are discussed in detail. The main target of this chapter is to provide readers with enough information about AlN substrate preparation to understand and make informed decisions about employing AlN substrates for deep-UV optoelectronics.
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Note that the absorption spectra for samples 6 and 7 differ to the ones shown in [78], as they were measured on similar crystals with virtually the same impurity concentrations. Furthermore, absorption coefficients above 700 cm−1 (sample 6) contain measurement artifacts
The silicon concentrations of samples 1 through 7 are corrected to reflect a calibration error which was found after the values cited in the references [75,78,112] had been published
Acknowledgments
The author acknowledges contributions of J. Wollweber, C Hartmann, A. Dittmar, K. Irmscher, T. Schulz, F. Langhans, S. Kollowa, C. Guguschev, M. Pietsch, A. Kwasniewski, M. Albrecht, M. Naumann, T. Neugut, and U. Juda from the Leibniz Institute for Crystal Growth. The author also thanks B.M. Epelbaum, O. Filip, P. Heimann, and A. Winnacker for the joint work on bulk AlN growth at the Department of Materials Science 6, University of Erlangen-Nuremberg, Germany, now continued in the company CrystAl-N.
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Bickermann, M. (2016). Growth and Properties of Bulk AlN Substrates. In: Kneissl, M., Rass, J. (eds) III-Nitride Ultraviolet Emitters. Springer Series in Materials Science, vol 227. Springer, Cham. https://doi.org/10.1007/978-3-319-24100-5_2
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