Abstract
Software systems have become an integral part of all the organizations. These systems are performing many critical operations. A defect in these systems affects the product quality and the software development process. Prediction of the impact category of these defects helps in improving defect management process as well as taking correct decisions to fix defects. Orthogonal defect classification is a popular model for classifying defects and it provides an in-depth analysis of the defects. In this study, we proposed an auto classify approach to classify the defects into impact categories as defined by Orthogonal Defect Classification (ODC). Bag of words, term frequency-inverse document frequency and word embedding have been used to represent the textual data into numeric vectors. For experimental work, we have used 4,096 reports form three NoSQL databases. We have trained and tested the proposed autoclassify approach using Support Vector Machine (SVM) and Random Forest Classifier (RFC). We achieved maximum accuracy 94% and 85.99% using SVM and RFC respectively.
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References
Chillarege, R., et al.: Orthongonal defect classification-a concept for in-process measurements. IEEE Trans. Software Eng. 18(11), 943–956 (1992)
Chillarege, R.: Orthogonal defect classification. In: Lyu, M.R. (ed.) Handbook of Software Reliability Engineering, pp. 359–399. IEEE CS Press, Los Alamitos (1996)
Bridge, N., Miller, C.: Orthogonal defect classification using defect data to improve software development. Softw. Qual. 3(1), 1–8 (1998)
Zheng, J., Williams, L.: Nagappan, N., Snipes, W., Hudepohl, J. P., Vouk, M. A.: On the value of static analysis for fault detection in software. IEEE Trans. Softw. Eng. 32(4), 240–253 (2006)
Thung, F., Lo, D. Jiang, L.: Automatic defect categorization. In 19th Working Conference on Reverse Engineering, pp. 205–214. IEEE (2012)
Thung, F., Le, X.B.D., Lo, D.: Active semi-supervised defect categorization. In: IEEE 23rd International Conference on Program Comprehension, pp. 60–70. IEEE (2015)
Liu, C., Zhao, Y., Yang, Y., Lu, H., Zhou, Y., Xu, B.: An AST-based approach to classifying defects. In: IEEE International Conference on Software Quality, Reliability and Security-Companion, pp. 14–21. IEEE (2015)
Huang, L., et al.: AutoODC: automated generation of orthogonal defect classifications. Autom. Softw. Eng. 22(1), 3–46 (2015)
Hernández-González, J., Rodriguez, D., Inza, I., Harrison, R., Lozano, J.A.: Learning to classify software defects from crowds: a novel approach. Appl. Soft Comput. 62, 579–591 (2018)
Lopes, F., Agnelo, J., Teixeira, C.A., Laranjeiro, N., Bernardino, J.: Automating orthogonal defect classification using machine learning algorithms. Futur. Gener. Comput. Syst. 102, 932–947 (2020)
Kumar, L., Kumar, M., Murthy, L.B., Misra, S., Kocher, V. Padmanabhuni, S.: An empirical study on application of word embedding techniques for prediction of software defect severity level. In:16th Conference on Computer Science and Intelligence Systems (FedCSIS), pp. 477–484. IEEE (2021)
Singh, V.B., Misra, S., Sharma, M.: Defect severity assessment in cross project context and identifying training candidates. J. Inf. Knowl. Manag. 16(01), 1750005 (2002)
Pennington, J., Socher, R., Manning, C.D.: Glove: global vectors for word representation. EMNLP 14, 1532–1543 (2014)
Sangwan, N., Bhatnagar, V.: Optimized text classification using deep learning. In: Goar, V., Kuri, M., Kumar, R., Senjyu, T. (eds.) Advances in Information Communication Technology and Computing. LNNS, vol. 135, pp. 293–302. Springer, Singapore (2021). https://doi.org/10.1007/978-981-15-5421-6_30
Sivakumar, S., Rajalakshmi, R.: Analysis of sentiment on movie reviews using word embedding self-attentive LSTM. Int. J. Amb. Comput. Intell. 12(2), 33–52 (2021)
Bayer, M., Kaufhold, M., Reuter, C: A survey on data augmentation for text classification. arXiv preprint arXiv:2107.03158 (2021)
Rahimi, Z., Homayounpour, M.M.: TensSent: a tensor based sentimental word embedding method. Appl. Intell. 51(8), 6056–6071 (2021). https://doi.org/10.1007/s10489-020-02163-8
Lu, X., et al.: MKPM: Multi keyword-pair matching for natural language sentences. Appl. Intell. 52(2), 1878–1892 (2021). https://doi.org/10.1007/s10489-021-02306-5
Yue, C., Cao, H., Xu, G., Dong, Y.: Collaborative attention neural network for multi-domain sentiment classification. Appl. Intell. 51(6), 3174–3188 (2020). https://doi.org/10.1007/s10489-020-02021-7
Cortes, C., Vapnik, V.: Support-vector networks. Mach. Learn. 20(3), 273–297 (1995)
Duan, K.B., Keerthi, S.S.: Which is the best multiclass SVM method? An empirical study. In: Oza, N.C., Polikar, R., Kittler, J., Roli, F. (eds.) MCS 2005. LNCS, vol. 3541, pp. 278–285. Springer, Heidelberg (2005). https://doi.org/10.1007/11494683_28
Breiman, L.: Random Forests. Mach Learn. 45, 5–32 (2001)
Breiman, L.: Bagging predictors. Mach. Learn. 24(2), 123–140 (1996)
Chawla, N.V., Bowyer, K.W., Hall, L.O., Kegelmeyer, W.P.: SMOTE: synthetic minority over-sampling technique. J. Artif. Intell. Res. 16, 321–357 (2002)
Asudani, D. S., Nagwani, N.K., Singh, P.: Exploring the effectiveness of word embedding based deep learning model for improving email classification. Data Technol. Appl. 56(1) (2022). https://doi.org/10.1108/dta-07-2021-0191. ISSN: 2514:9288
Hossain, T., Mauni, H.Z., Rab, R.: Reducing the effect of imbalance in text classification using SVD and GloVe with ensemble and deep learning. Comput. Inform. 41(1), 98–115 (2022)
Ebrahimi, F., Tushev, M., Mahmoud, A.: Classifying mobile applications using word embeddings. ACM Trans. Softw. Eng. Methodol. (TOSEM) 31(2), 1–30 (2021)
Kirelli, Y., Özdemir, Ş. Sentiment classification performance analysis based on glove word embedding. Sakarya Univ. J. Sci. 25(3), 639–646 (2021)
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Kumar, S., Sharma, M., Muttoo, S.K., Singh, V.B. (2022). Autoclassify Software Defects Using Orthogonal Defect Classification. In: Gervasi, O., Murgante, B., Misra, S., Rocha, A.M.A.C., Garau, C. (eds) Computational Science and Its Applications – ICCSA 2022 Workshops. ICCSA 2022. Lecture Notes in Computer Science, vol 13381. Springer, Cham. https://doi.org/10.1007/978-3-031-10548-7_23
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