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Terahertz Near-Field Imaging and Sensing

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Terahertz Antenna Technology for Imaging and Sensing Applications

Abstract

The terahertz imaging systems are broadly classified as: (1) far-field imaging systems and (2) near-field imaging systems. As per the salient features of these two types of imaging systems, both the systems have been explored and utilized by researchers in several imaging applications. This chapter explores the terahertz near-field imaging and sensing. Recent advances of the near-field imaging techniques with its measurement techniques are discussed and an analytical estimate based on Kirchhoff’s formalism for near-field is presented. The imaging systems are based on either near-field or far-field set-up depending upon the application. The terahertz near-field imaging approach provides time and spatially resolved measurements of the electric field distribution in the vicinity of structured samples with subwavelength spatial resolution. The state-of-the-art measurement techniques of near-field imaging are in progress for several application areas. Using the Kirchhoff formalism, the near-field enhancement can be estimated from the far-field measurements and is analytically discussed. The practical implementations of metasurface or slits or holes hold promise for near-field terahertz beam steering, laser-based microscopy, non-contact sensing, imaging, and lithography applications. Moreover, the terahertz field enhancements would trigger various future investigations such as terahertz nonlinearity measurement, terahertz controlled nano-optics devices, and single-molecule detection using terahertz waves.

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Authors and Affiliations

  1. Electronics and Communication Engineering, Dronacharya College of Engineering, Gurugram, Haryana, India

    Isha Malhotra

  2. Electrical and Electronics Engineering Science, University of Johannesburg, Johannesburg, South Africa

    Ghanshyam Singh

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  1. Isha Malhotra
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Malhotra, I., Singh, G. (2021). Terahertz Near-Field Imaging and Sensing. In: Terahertz Antenna Technology for Imaging and Sensing Applications. Springer, Cham. https://doi.org/10.1007/978-3-030-68960-5_9

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