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Low-Uncertainty Equality Between the Voltage-Dividing and Resistance Ratio of a DC Resistive High Voltage Divider

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Abstract

The comparison results for the resistance and voltage-dividing ratios of a direct current (DC) high-voltage divider at the low-voltage level were presented. The two ratios were equal within 0.3 × 10−6 for the 2250:1 ratio and within 0.5 × 10−6 for the 15,000:1, 13,500:1, 6750:1, and 675:1 ratios. The results show that the divider can be used as a reference voltage-dividing ratio device within a 0.5 × 10−6 agreement with sub-ppm uncertainty at low voltage, irrespective of which of the two ratios is selected. It was also confirmed that the two ratios were traceable to quantum Hall resistance and Josephson voltage standards with a 0.4 × 10−6 (k = 1) uncertainty level up to 1 kV.

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References

  1. Sun K, Yuan S, Qiu Y (2017) Chapter 2 development of UHV power transmission in China. In: Zhou H et al (eds) Ultra-high voltage AC/DC power transmission. Springer, Berlin, pp 23–37

    Chapter  Google Scholar 

  2. Kaczmarek RV, Conway BJ, Slayton RO, Suleiman OH (2000) Results of a nationwide survey of chest radiography: comparison with results of a previous study. Radiology 215:891–896

    Article  Google Scholar 

  3. Bauer S, Berendes R, Hochschulz F, Ortjohann HW, Rosendahl S, Thümmler T, Schmidt M, Weinheimer C (2013) Next generation KATRIN high precision voltage divider for voltages up to 65kV. J Instrum 8:P10026

    Article  Google Scholar 

  4. Lee JH et al (2016) Electromechanical properties and spontaneous response of the current in InAsP nanowires. Nano Lett 16:6738–6745

    Article  Google Scholar 

  5. EURAMET (European Association of National Metrology Institutes).EM-S14 (2006) Report on comparison (EUROMET project 495): measurements up to 100 kV DC (Supplementary Comparison Final Report, R G Jones, NPL, UK, November 2006)

  6. EURAMET (European Association of National Metrology Institutes).EM-S29 (2011) Traceability of DC high voltage reference measuring systems up to 200 kV. Madrid (Supplementary Comparison Final Report, November 2011)

  7. Li Y, Rungis J, Jing T, Su TH, Chen IP, Lee D, Shimizu K (2000) International comparison of a resistive divider at 100 kV DC. IEEE Trans Instrum Meas 50:436–439

    Article  Google Scholar 

  8. Bergman A et al (2013) Metrology for high voltage direct current. ENG07 HVDC, JRP Report EURAMET (European Association of National Metrology Institutes) EMRP (European Metrology Research Program)

  9. Li Y, Ediriweera MK, Emms FS, Lohrasby A (2011) Development of precision DC high-voltage dividers. IEEE Trans Instrum Meas 60:2211–2216

    Article  Google Scholar 

  10. Park JH (1962) Special shielded resistor for high-voltage DC measurements. J Res Natl Bur Stand C Eng Instrum 66C:19–24

    Article  Google Scholar 

  11. Yu KM, Kim WS, Lee SH, Han KS, Kang JH (2014) A method for measuring high resistances with negligible leakage effect using one voltage source and one voltmeter. Meas Sci Technol 25:075012

    Article  Google Scholar 

  12. Henderson LCA (1987) A new technique for the automated measurement of high valued resistors. J Phys E Sci Instrum 20:492–495

    Article  Google Scholar 

  13. Lee SH, Yu KM, Kang JH, Kim MS, Kim KT (2012) A Josephson voltage-traceable DC high-voltage divider evaluation using the binary step-up method. Measurement 45:488–492

    Article  Google Scholar 

  14. ISO (International Organization for Standardization)/IEC (International Electrotechnical Commission) (2008) Guide to the expression of uncertainty in measurement (GUM:1995). ISO (International Organization for Standardization)/IEC Guide 98

  15. Field BF (1985) A sub-PPM automated 1–10 volt DC measuring system. IEEE Trans Instrum Meas IM-34 2:327–330

  16. Lee KC, Cage ME, Rowe PS (1994) Sources of uncertainty in a DVM-based measurement system for a quantized Hall resistance standard. J Res Natl Inst Stand Technol 99:227–240

    Article  Google Scholar 

  17. Cage ME, Yu D, Jeckelmann BM, Steiner RL, Duncan RV (1991) Investigating the use of multimeters to measure quantized Hall resistance standards. IEEE Trans Instrum Meas 40:262–266

    Article  Google Scholar 

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Authors and Affiliations

  1. Division of Physical Metrology, Korea Research Institute of Standards and Science (KRISS), 267 Gajeong-ro, Yuseong-gu, Daejeon, 34113, South Korea

    Sang Hwa Lee, Kwang Min Yu & Seok Myeong Jang

  2. Department of Electrical Engineering, Chungnam National University, 99 Daehak-ro, Yuseong-gu, Daejeon, 34134, South Korea

    Jang Young Choi

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  1. Sang Hwa Lee
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  2. Kwang Min Yu
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  3. Jang Young Choi
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  4. Seok Myeong Jang
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Correspondence to Kwang Min Yu.

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Lee, S.H., Yu, K.M., Choi, J.Y. et al. Low-Uncertainty Equality Between the Voltage-Dividing and Resistance Ratio of a DC Resistive High Voltage Divider. J. Electr. Eng. Technol. 14, 1789–1795 (2019). https://doi.org/10.1007/s42835-019-00157-2

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  • DOI: https://doi.org/10.1007/s42835-019-00157-2

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