Abstract
Stresses that develop because of the coefficient of thermal expansion (CTE) mismatch between solder and substrate/components contribute to thermomechanical fatigue (TMF) of the solder joints. However, the relative importance of several processes that contribute to damage accumulation and its role in affecting the reliability of the solder joints are far from being understood. Aging, creep/stress relaxation, and stress/strain reversals are some of the important processes. These processes are affected by service conditions, such as the temperature extremes experienced, rates of heating and cooling, dwell times at the extreme temperatures, and so on. In addition, the elastic and plastic anisotropy of tin could also contribute to the damage accumulation during TMF of Sn-based solders. This preliminary effort to model TMF in Sn-Ag solder joints will consider the role of each of these parameters, with significant emphasis on the anisotropic-elastic behavior of Sn grains.
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Lee, J.G., Telang, A., Subramanian, K.N. et al. Modeling thermomechanical fatigue behavior of Sn-Ag solder joints. J. Electron. Mater. 31, 1152–1159 (2002). https://doi.org/10.1007/s11664-002-0004-z
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DOI: https://doi.org/10.1007/s11664-002-0004-z