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Simulation of NC-AFM images of xenon(111)

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Abstract.

Experimental results recently obtained for Xe(111) are simulated introducing a method which allows the time-effective simulation of complete non-contact atomic force microscopy (NC-AFM) images for non-reactive surfaces. All features of the experimental image are successfully reproduced. Additionally, the comparison between experiment and simulation allows the maxima in the experimental image to be identified as the actual positions of the xenon atoms.

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Authors and Affiliations

  1. Institute of Applied Physics and Microstructure Research Center, University of Hamburg, Jungiusstr. 11, 20355 Hamburg, Germany, DE

    H. Hölscher, W. Allers, U.D. Schwarz, A. Schwarz & R. Wiesendanger

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  1. H. Hölscher
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  2. W. Allers
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  3. U.D. Schwarz
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  4. A. Schwarz
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  5. R. Wiesendanger
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Received: 16 July 2000 / Accepted: 14 December 2000 / Published online: 27 March 2001

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Hölscher, H., Allers, W., Schwarz, U. et al. Simulation of NC-AFM images of xenon(111) . Appl Phys A 72 (Suppl 1), S35–S38 (2001). https://doi.org/10.1007/s003390100724

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  • DOI: https://doi.org/10.1007/s003390100724

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