Abstract
Many of the properties of multi-material systems and relevant devices depend on the interfaces between the different components. This review focuses on characterization of the interfaces between intrinsically conducting polymers and inorganic materials consisting of metals and metal oxides. These materials are chosen because of their importance in several analytical applications. Although use of conducting polymers and metals or metal oxides in analytical systems, specifically in sensing, is well established, the number of novel materials used for analytical purposes is continuously increasing. This further increases the possible number of effective combinations of different materials within multicomponent systems. As a consequence, innovative characterization techniques have become as important as more conventional techniques. On the other hand, sophisticated characterisation techniques are increasingly widespread and, consequently, also readily accessible. This critical review is not an exhaustive discussion of all possible analytical techniques suitable for characterization of interfaces. It is, instead, limited to an overview of the most effective, relatively widespread techniques, emphasising their most significant recent advances. Critical analysis of the individual techniques is complemented by a few selected examples.
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Abbreviations
- AFM:
-
Atomic-force microscopy
- An:
-
Aniline
- EELS:
-
Electron energy loss spectroscopy
- F8BT:
-
Poly[(9,9-dioctylfluorenyl-2,7-diyl)-co-(1,4-benzo-[2,1′,3]-thiadiazole)]
- FIB:
-
Fast ion bombardment
- HAXPES:
-
Hard X-ray photoelectron spectroscopy
- ICP:
-
Intrinsically conducting polymer
- IRRAS:
-
Infrared reflection absorption spectroscopy
- ITO:
-
Indium tin oxide
- NEXAFS:
-
Near-edge X-ray absorption fine structure
- OLED:
-
Organic light-emitting diodes
- P3HT:
-
Poly(3-hexylthiophene)
- PEDOT:
-
Poly(3,4-ethylenedioxythiophene)
- PEEM:
-
Photoemission electron microscope
- PFB:
-
Poly[9,9′-dioctylfluorene-co-bis-N,N′-(4-butylphenyl)-bis-N,N′-phenyl-1,4-phenylenediamine]
- PSS:
-
Polystyrenesulfonate
- Py:
-
Pyrrole
- RSoXR:
-
Resonant soft X-ray reflectivity
- RSoXS:
-
Resonant soft-X-ray scattering
- SAM:
-
Self-assembled monolayer
- SE:
-
Spectroscopic ellipsometry
- SECM:
-
Scanning electrochemical microscopy
- SEM:
-
Scanning electron microscopy
- SERS:
-
Surface-enhanced Raman spectroscopy
- SFG:
-
Sum frequency generation
- SIMS:
-
Secondary-ion mass spectrometry
- STEM:
-
Scanning TEM
- STM:
-
Scanning tunnelling microscopy
- TEM:
-
Transmission electron microscopy
- Th:
-
Thiophene
- XAS:
-
X-ray absorption spectroscopy
- XRR:
-
X-ray reflectivity
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Published in the topical collection Characterization of Thin Films and Membranes with guest editors Daniel Mandler and Pankaj Vadgama.
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Terzi, F., Pasquali, L. & Seeber, R. Studies of the interface of conducting polymers with inorganic surfaces. Anal Bioanal Chem 405, 1513–1535 (2013). https://doi.org/10.1007/s00216-012-6455-z
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DOI: https://doi.org/10.1007/s00216-012-6455-z