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Fine genetic mapping of spot blotch resistance gene Sb3 in wheat (Triticum aestivum)

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Spot blotch disease resistance gene Sb3 was mapped to a 0.15 centimorgan (cM) genetic interval spanning a 602 kb physical genomic region on chromosome 3BS.

Abstract

Wheat spot blotch disease, caused by B. sorokiniana, is a devastating disease that can cause severe yield losses. Although inoculum levels can be reduced by planting disease-free seed, treatment of plants with fungicides and crop rotation, genetic resistance is likely to be a robust, economical and environmentally friendly tool in the control of spot blotch. The winter wheat line 621-7-1 confers immune resistance against B. sorokiniana. Genetic analysis indicates that the spot blotch resistance of 621-7-1 is controlled by a single dominant gene, provisionally designated Sb3. Bulked segregant analysis (BSA) and simple sequence repeat (SSR) mapping showed that Sb3 is located on chromosome arm 3BS linked with markers Xbarc133 and Xbarc147. Seven and twelve new polymorphic markers were developed from the Chinese Spring 3BS shotgun survey sequence contigs and 3BS reference sequences, respectively. Finally, Sb3 was mapped in a 0.15 cM genetic interval spanning a 602 kb physical genomic region of Chinese Spring chromosome 3BS. The genetic and physical maps of Sb3 provide a framework for map-based cloning and marker-assisted selection (MAS) of the spot blotch resistance.

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Acknowledgments

This work was financially supported by National Science Foundation of China (31571642, 31210103902), Ministry of Science & Technology of China (2011AA100104), and Ministry of Education (MOE) of China (111-02-3).

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  1. State Key Laboratory for Agrobiotechnology/Department of Plant Genetics and Breeding, China Agricultural University, Beijing, 100193, China

    Ping Lu, Yong Liang, Delin Li, Wenbin Li, Guoxin Wang, Yong Wang, Shenghui Zhou, Qiuhong Wu, Jingzhong Xie, Deyun Zhang, Yongxing Chen, Miaomiao Li, Yan Zhang, Qixin Sun, Chenggui Han & Zhiyong Liu

  2. China Rural Technology Development Center, Beijing, 100045, China

    Zhengzhong Wang

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Lu, P., Liang, Y., Li, D. et al. Fine genetic mapping of spot blotch resistance gene Sb3 in wheat (Triticum aestivum). Theor Appl Genet 129, 577–589 (2016). https://doi.org/10.1007/s00122-015-2649-z

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