Abstract
From crystal to crystal comparison, thed 220 lattice spacing in PERFX and WASO silicon crystals used in the only two existing absolute measurements have been found to be equal within ±2×10−7 d 220. This demonstrates that generic variabilities of the two crystals account only for a small part of the 1.8×10−6 d 220 difference in the two absolute measurements. In a new series of 336 single measurements, ourd 220 value reported recently has been confirmed within ±2×10−8 d 220. From these results we derive the following lattice parameter for highly pure silicon single crystals:a 0=(543 102.018±0.034) fm (at 22.5°C, in vacuum).
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Becker, P., Scyfried, P. & Siegert, H. The lattice parameter of highly pure silicon single crystals. Z. Physik B - Condensed Matter 48, 17–21 (1982). https://doi.org/10.1007/BF02026423
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DOI: https://doi.org/10.1007/BF02026423