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Four-path interference and uncertainty principle in photodetachment microscopy

T. Kramer et al 2001 Europhys. Lett. 56 471-477   doi: 10.1209/epl/i2001-00543-x  Help

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T. Kramer, C. Bracher and M. Kleber
Physik-Department T30, Technische Universität München James-Franck-Straße, 85747 Garching, Germany
E-mail: tkramer@ph.tum.de

Abstract. We study the quantal motion of electrons emitted by a pointlike monochromatic isotropic source into parallel uniform electric and magnetic fields. The two-path interference pattern in the emerging electron wave due to the electric force is modified by the magnetic lens effect which periodically focuses the beam into narrow filaments along the symmetry axis. There, four classical paths interfere. With increasing electron energy, the current distribution changes from a quantum regime governed by the uncertainty principle, to an intricate spatial pattern that yields to a semiclassical analysis.

PACS numbers: 03.65.Sq, 03.75.-b, 32.80.Gc

Print publication: Issue 4 (November 2001)
Received 5 June 2001, accepted for publication 22 August 2001

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