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Nondestructive two-dimensional refractive-index profiling of integrated-optical waveguides by an interferometric method

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Abstract

We describe an interferometric method that uses an interference microscope that permits the determination of the complete two-dimensional refractive-index profile of integrated optical waveguides, provided that the form of the one-dimensional depth profile is known. Results are reported for potassium–sodium ion-exchanged channel waveguides and are shown to be in good agreement with theory.

© 1991 Optical Society of America

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